Thermal management of high performance test socket for wafer level package

Author(s):  
Yong Han ◽  
Seow Meng Low ◽  
Jason Goh
Sensors ◽  
2017 ◽  
Vol 17 (3) ◽  
pp. 599 ◽  
Author(s):  
Liying Wang ◽  
Xiaohui Du ◽  
Lingyun Wang ◽  
Zhanhao Xu ◽  
Chenying Zhang ◽  
...  

Author(s):  
Badakere Guruprasad ◽  
Yaojian Lin ◽  
M. Pandi Chelvam ◽  
Seung Wook Yoon ◽  
Kai Liu ◽  
...  

Author(s):  
Lewis(In Soo) Kang

The market of Connectivity, Internet of Things (IoT), Wearable and Smart industrial applications leads Fan Out Wafer Level Package (FOWLP) technologies to a promising solution to overcome the limitation of conventional wafer level package, flip chip package and wire bonding package in terms of the solution of low cost, high performance and smaller form factor packaging. Moreover, FOWLP technology can be extended to system-in-package (SiP) area, such as multi chip 2D package and 3D stack package types. nepes Corporation has developed several advanced package platforms such as single, multi dies and 2D, 3D packaging by using FOWLP and embedding technologies. To fulfill SiP (system-in-package) with FOWLP, several dies and components have been embedded into one package which offers 40~90 % of volumetric shrink compared to the current module system with the flexibility of product design for end users. 3D package technology of PoP (Package on Package) structure will be introduced for communication module and system control application.


2001 ◽  
Author(s):  
Chirag Patel ◽  
Kevin P. Martin ◽  
James D. Meindl

Abstract A high I/O density and high performance wafer level packaging technology called the Compliant Wafer Level Package (CWLP) is reported. The necessity for compliant interconnects in upcoming generations of electronic products is discussed by analyzing the technology requirements projected by the International Technology Roadmap for Semiconductors (ITRS). To be a true wafer level package, the technology should have following three characteristics11: I) package all Integrated Circuits (ICs) intact on wafer at once, II) perform wafer level test and burn-in, and III) assemble the WLP on the system board without using an underfill. Compliant interconnects are essential to accomplishing wafer level test and assembly without underfill. These topics are discussed in the paper followed by fabrication and performance analysis of the CWLP technology.


2011 ◽  
Vol 77 (775) ◽  
pp. 573-581
Author(s):  
Isamu TSUJI ◽  
Hiroshi GUNBARA ◽  
Kazumasa KAWASAKI ◽  
Yoshikazu ABE ◽  
Kazutaka SUZUKI ◽  
...  

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