Thermal performance characterization of nano thermal interface materials after power cycling

2012 ◽  
Author(s):  
Shuangxi Sun ◽  
Luo Xin ◽  
Carl Zanden ◽  
Bjorn Carlberg ◽  
Lilei Ye ◽  
...  
Keyword(s):  
Thermal Performance ◽  
Thermal Interface Materials ◽  
Performance Characterization ◽  
Thermal Interface ◽  
Power Cycling ◽  
Interface Materials

Mechanical Characterization of Thermal Interface Materials and Its Challenges

2019 ◽  
Vol 141 (1) ◽  
Author(s):  
Vijay Subramanian ◽  
Jorge Sanchez ◽  
Joseph Bautista ◽  
Yi He ◽  
Jinlin Wang ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Polymer Matrix ◽  
Thermal Performance ◽  
Mechanical Characterization ◽  
Thermal Interface Materials ◽  
Thermal Interface ◽  
Compression Set ◽  
Thermal Solution ◽  
Interface Materials

Thermal interface materials (TIMs) play a vital role in the performance of electronic packages by enabling improved heat dissipation. These materials typically have high thermal conductivity and are designed to offer a lower thermal resistance path for efficient heat transfer. For some semiconductor components, thermal solutions are attached directly to the bare silicon die using TIM materials, while other components use an integrated heat spreader (IHS) attached on top of the die(s) and the thermal solution attached on top of the IHS. For cases with an IHS, two TIM materials are used—TIM1 is applied between the silicon die and IHS and TIM2 is used between IHS and thermal solution. TIM materials are usually comprised of a polymer matrix with thermally conductive fillers such as silica, aluminum, alumina, boron nitride, zinc oxide, etc. The polymer matrix wets the contact surface to lower the contact resistance, while the fillers help reduce the bulk resistance by increasing the bulk thermal conductivity. TIM thickness varies by application but is typically between 25 μm and around 250 μm. Selection of appropriate TIM1 and TIM2 materials is necessary for the reliable thermal performance of a product over its life and end-use conditions. It has been observed that during reliability testing, TIM materials are prone to degradation which in turn leads to a reduction in the thermal performance of the product. Typical material degradation is in the form of hardening, compression set, interfacial delamination, voiding, or excessive bleed-out. Therefore, in order to identify viable TIM materials, characterization of the thermomechanical behavior of these materials becomes important. However, developing effective metrologies for TIM characterization is difficult for two reasons: TIM materials are very soft, and the sample thickness is very small. Therefore, a well-designed test setup and a repeatable sample preparation and test procedure are needed to overcome these challenges and to obtain reliable data. In this paper, we will share some of the TIM characterization techniques developed for TIM material down-selection. The focus will be on mechanical characterization of TIM materials—including modulus, compression set, coefficient of thermal expansion (CTE), adhesion strength, and pump-out/bleed-out measurement techniques. Also, results from several TIM formulations, such as polymer TIMs and thermal gap pads, will be shared.

Characterizing Bulk Thermal Conductivity and Interface Contact Resistance Effects of Thermal Interface Materials in Electronic Cooling Applications

2003 ◽  
Author(s):  
Vadim Gektin ◽  
Sai Ankireddi ◽  
Jim Jones ◽  
Stan Pecavar ◽  
Paul Hundt
Keyword(s):  
Thermal Conductivity ◽  
Thermal Resistance ◽  
Contact Resistance ◽  
Thermal Performance ◽  
Electronic Cooling ◽  
Thermal Interface Materials ◽  
Thermal Interface ◽  
Interface Contact ◽  
Interface Materials ◽  
Bulk Thermal Conductivity

Thermal Interface Materials (TIMs) are used as thermally conducting media to carry away the heat dissipated by an energy source (e.g. active circuitry on a silicon die). Thermal properties of these interface materials, specified on vendor datasheets, are obtained under conditions that rarely, if at all, represent real life environment. As such, they do not accurately portray the material thermal performance during a field operation. Furthermore, a thermal engineer has no a priori knowledge of how large, in addition to the bulk thermal resistance, the interface contact resistances are, and, hence, how much each influences the cooling strategy. In view of these issues, there exists a need for these materials/interfaces to be characterized experimentally through a series of controlled tests before starting on a thermal design. In this study we present one such characterization for a candidate thermal interface material used in an electronic cooling application. In a controlled test environment, package junction-to-case, Rjc, resistance measurements were obtained for various bondline thicknesses (BLTs) of an interface material over a range of die sizes. These measurements were then curve-fitted to obtain numerical models for the measured thermal resistance for a given die size. Based on the BLT and the associated thermal resistance, the bulk thermal conductivity of the TIM and the interface contact resistance were determined, using the approach described in the paper. The results of this study permit sensitivity analyses of BLT and its effect on thermal performance for future applications, and provide the ability to extrapolate the results obtained for the given die size to a different die size. The suggested methodology presents a readily adaptable approach for the characterization of TIMs and interface/contact resistances in the industry.

Mechanical Insertion and Reliability Testing of Thermal Interface Materials for Semiconductor Test and Burn-in Applications

2018 ◽  
Vol 2018 (1) ◽  
pp. 000613-000618
Author(s):  
Dave Saums ◽  
Tim Jensen ◽  
Carol Gowans ◽  
Seth Homer ◽  
Ron Hunadi
Keyword(s):  
Thermal Performance ◽  
Mechanical Performance ◽  
Device Under Test ◽  
Thermal Interface Materials ◽  
Reliability Testing ◽  
Mechanical Reliability ◽  
Thermal Interface ◽  
Cycling Test ◽  
Semiconductor Test ◽  
Interface Materials

Abstract Semiconductor test and burn-in requirements for thermal interface materials (TIMs) are challenging, with difficult mechanical reliability requirements that are not found in other types of applications for these materials. To demonstrate the ability of certain newly-developed TIMs to not only provide suitable thermal performance for the device under test and meet these mechanical requirements, a contact cycling test has been devised in three phases for evaluating TIM mechanical performance and durability.

Thermal and Mechanical Properties of Silicone Thermal Interface Materials With Varying Cross-Link Densities

2005 ◽  
Author(s):  
Arun Gowda ◽  
Annita Zhong ◽  
Sandeep Tonapi ◽  
Kaustubh Nagarkar ◽  
K. Srihari
Keyword(s):  
Mechanical Properties ◽  
Thermal Performance ◽  
Cross Linking ◽  
Thermal Interface Materials ◽  
Material System ◽  
Thermal And Mechanical Properties ◽  
Thermal Impedance ◽  
Operating Life ◽  
Thermal Interface ◽  
Interface Materials

Thermal Interface Materials (TIMs) play a key role in the thermal management of microelectronics by providing a path of low thermal impedance between the heat generating devices and the heat dissipating components (heat spreader/sink). In addition, TIMs need to reliably maintain this low thermal resistance path throughout the operating life of the device. Currently, several different TIM material solutions are employed to dissipate heat away from semiconductor devices. Thermal greases, adhesives, gels, pads, and phase change materials are among these material solutions. Each material system has its own advantages and associated application space. While thermal greases offer excellent thermal performance, their uncured state makes them susceptible to pump-out and other degradation mechanisms. On the other hand, adhesives offer structural support but offer a higher heat resistance path. Gels are designed to provide a level of cross-linking to allow the thermal performance of greases and prevent premature degradation. However, the degree of crosslinking can have a significant effect of the behavior of gels. In this research, TIMs with varying cross-linking densities are studied and their thermal and mechanical properties reported. The base resin systems and fillers were maintained constant, while slight compositional alternations were made to induce different degrees of cross-linking.

Durability of Low Melt Alloys as Thermal Interface Materials

2016 ◽  
Vol 138 (1) ◽  
Author(s):  
Chandan K. Roy ◽  
Sushil Bhavnani ◽  
Michael C. Hamilton ◽  
R. Wayne Johnson ◽  
Roy W. Knight ◽  
...  
Keyword(s):  
Thermal Performance ◽  
Performance Testing ◽  
Thermal Interface Materials ◽  
Thermal Interface ◽  
High Performing ◽  
Accelerated Life ◽  
Significant Performance ◽  
Interface Materials ◽  
Temperature Aging

This study investigates the reliability of low melt alloys (LMAs) containing gallium (Ga), indium (In), bismuth (Bi), and tin (Sn) for the application as Thermal interface materials (TIMs). The analysis described herein involved the in situ thermal performance of the LMAs as well as performance evaluation after accelerated life cycle testing, which included high temperature aging at 130 °C and thermal cycling from −40 °C to 80 °C. Three alloys (75.5Ga & 24.5In, 100Ga, and 51In, 32.5Bi & 16.5Sn) were chosen for testing the thermal performance. Testing methodologies used follow ASTM D5470 protocols and the performance of LMAs is compared with some high-performing commercially available TIMs. Results show that LMAs can offer extremely low (<0.01 cm2 °C/W) thermal resistance compared to any commercial TIMs. The LMA–substrate interactions were explored using different surface treatments (copper and tungsten). Measurements show that depending on the substrate–alloy combinations, the proposed alloys survive 1500 hrs of aging at 130 °C and 1000 cycles from −40 °C to 80 °C without significant performance degradation. The obtained results indicate the LMAs are very efficient as TIMs.

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