On RTL Testability and Gate-Level Stuck-At-Fault Coverage Correlation for Scan Circuits

2011 ◽  
Author(s):  
Michal Rumplik ◽  
Josef Strnadel
Keyword(s):  
Fault Coverage ◽  
Scan Circuits

A new BIST scheme with encoding logic to achieve complete fault coverage

2015 ◽  
Author(s):  
Ling Zhang ◽  
Junjin Mei ◽  
Guan-zhong Wang ◽  
Tonghan Li
Keyword(s):  
Fault Coverage

scholarly journals Fault Coverage-Aware Metrics for Evaluating the Reliability Factor of Solar Tracking Systems

Energies ◽  
2021 ◽  
Vol 14 (4) ◽  
pp. 1074
Author(s):  
Raul Rotar ◽  
Sorin Liviu Jurj ◽  
Flavius Opritoiu ◽  
Mircea Vladutiu
Keyword(s):  
High Performance ◽  
Computation Time ◽  
Fault Coverage ◽  
Programming Environment ◽  
Tracking Systems ◽  
Circuit Testing ◽  
Reliability Factor ◽  
Solar Tracking ◽  
Mathcad Software ◽  
Python Programming

This paper presents a mathematical approach for determining the reliability of solar tracking systems based on three fault coverage-aware metrics which use system error data from hardware, software as well as in-circuit testing (ICT) techniques, to calculate a solar test factor (STF). Using Euler’s named constant, the solar reliability factor (SRF) is computed to define the robustness and availability of modern, high-performance solar tracking systems. The experimental cases which were run in the Mathcad software suite and the Python programming environment show that the fault coverage-aware metrics greatly change the test and reliability factor curve of solar tracking systems, achieving significantly reduced calculation steps and computation time.

A method for consistent fault coverage reporting

1993 ◽  
Vol 10 (3) ◽  
pp. 68-79 ◽  
Author(s):  
W.H. Debany ◽  
K.A. Kwiat ◽  
S.A. Al-Arian
Keyword(s):  
Fault Coverage
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