A design flow for protecting FPGA-based systems against single event upsets

2006 ◽  
Author(s):  
L. Sterpone ◽  
M. Violante
Keyword(s):  
Design Flow ◽  
Single Event ◽  
Single Event Upsets

scholarly journals Fault-tolerant ASIC: Design and implementation

2013 ◽  
Vol 26 (3) ◽  
pp. 175-186 ◽  
Author(s):  
Z. Stamenkovic ◽  
V. Petrovic ◽  
G. Schoof
Keyword(s):  
Fault Tolerant ◽  
Logic Synthesis ◽  
Design Flow ◽  
Single Event ◽  
Asic Design ◽  
Single Event Upsets ◽  
Design And Implementation ◽  
Standard Design ◽  
Extra Step ◽  
Definition Of

The paper presents fault-tolerant CMOS ASICs which are immune to the single event upsets (SEU), the single event transients (SET), and the single event latchup (SEL). Triple and double modular redundant (TMR and DMR) circuits and SEL protection switches (SPS) make the base for a modified fault-tolerant ASIC design flow. The proposed design flow requires the standard design automation tools and a few additional steps during logic synthesis and layout generation. An extra step is necessary to generate the redundant design net-list including voters. Other two extra steps (definition of the redundant power domains and placement of the SPS) have to be performed in the layout phase. The concept has been proven by design and implementation of the two digital circuits: shift-register and synchronous counter.

Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMs

2005 ◽  
Vol 52 (6) ◽  
pp. 2319-2325 ◽  
Author(s):  
J. Baggio ◽  
V. Ferlet-Cavrois ◽  
D. Lambert ◽  
P. Paillet ◽  
F. Wrobel ◽  
...  
Keyword(s):  
Single Event ◽  
Fully Depleted ◽  
Single Event Upsets

Single event upsets in gallium arsenide dynamic logic

1994 ◽  
Vol 41 (6) ◽  
pp. 2244-2251 ◽  
Author(s):  
D.J. Fouts ◽  
T. Weatherford ◽  
D. McMorrow ◽  
J.S. Melinger ◽  
A.B. Campbell
Keyword(s):  
Gallium Arsenide ◽  
Dynamic Logic ◽  
Single Event ◽  
Single Event Upsets

(Invited) Total Dose Effects and Single Event Upsets During Radiation Damage of GaN and SiC

2021 ◽  
Vol 104 (7) ◽  
pp. 13-34
Author(s):  
Ani Khachatrian ◽  
Adrian Ildefonso ◽  
Zahabul Islam ◽  
Md Abu Jafar Rasel ◽  
Amanul Haque ◽  
...  
Keyword(s):  
Total Dose ◽  
Radiation Damage ◽  
Single Event ◽  
Single Event Upsets ◽  
Dose Effects ◽  
Total Dose Effects

Role of Elastic Scattering of Protons, Muons, and Electrons in Inducing Single-Event Upsets

2017 ◽  
Vol 64 (10) ◽  
pp. 2648-2660 ◽  
Author(s):  
Avraham Akkerman ◽  
Joseph Barak ◽  
Nir M. Yitzhak
Keyword(s):  
Elastic Scattering ◽  
Single Event ◽  
Single Event Upsets
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