RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)

Latent interface-trap generation in commercial power VDMOSFETs

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) ◽

10.1109/radecs.1997.698837 ◽

2002 ◽

Cited By ~ 1

Author(s):

A. Jaksic ◽

M. Pejovic ◽

G. Ristic ◽

S. Rakovic

Keyword(s):

Interface Trap

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Investigations of single-event upsets and charge collection in micro-electronics using variable-length laser-generated charge tracks

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) ◽

10.1109/radecs.1997.698921 ◽

2002 ◽

Author(s):

J.S. Melinger ◽

D. McMorrow ◽

S. Buchner ◽

A.R. Knudson ◽

L.H. Tran ◽

...

Keyword(s):

Variable Length ◽

Charge Collection ◽

Single Event ◽

Single Event Upsets

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Performance of Bragg and long-period gratings written in N- and Ge-doped silica fibers under γ-radiation

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) ◽

10.1109/radecs.1997.698978 ◽

2002 ◽

Author(s):

S.A. Vasiliev ◽

E.M. Dianov ◽

K.M. Golant ◽

O.I. Medvedkov ◽

A.L. Tomashuk ◽

...

Keyword(s):

Γ Radiation ◽

Long Period ◽

Silica Fibers ◽

Long Period Gratings

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Failure mode of different irradiated power IGBT structures

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) ◽

10.1109/radecs.1997.698988 ◽

2002 ◽

Cited By ~ 3

Author(s):

E. Lorfevre ◽

E. Dachs ◽

C. Detcheverry ◽

C. Sudre ◽

F. Roubaud ◽

...

Keyword(s):

Failure Mode

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MESFET destruction model and experimental validation

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) ◽

10.1109/radecs.1997.698881 ◽

2002 ◽

Cited By ~ 1

Author(s):

S. Telliez ◽

J.P. Brasile ◽

N. Samama

Keyword(s):

Experimental Validation

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Total dose hardness of three commercial CMOS microelectronics foundries

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) ◽

10.1109/radecs.1997.698906 ◽

2002 ◽

Cited By ~ 2

Author(s):

J.V. Osborn ◽

R.C. Lacoe ◽

D.C. Mayer ◽

G. Yabiku

Keyword(s):

Total Dose

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Radiation damage studies of optoelectronic components for the CMS tracker optical links

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) ◽

10.1109/radecs.1997.698956 ◽

2002 ◽

Cited By ~ 13

Author(s):

K. Gill ◽

V. Arbet-Engels ◽

J. Batten ◽

G. Cervelli ◽

R. Grabit ◽

...

Keyword(s):

Radiation Damage ◽

Optical Links

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Latch-up windows tests in high temperature range

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) ◽

10.1109/radecs.1997.698940 ◽

2002 ◽

Cited By ~ 2

Author(s):

A.Y. Nikiforov ◽

V.V. Bykov ◽

V.S. Figurov ◽

A.I. Chumakov ◽

P.K. Skorobogatov ◽

...

Keyword(s):

High Temperature ◽

High Temperature Range ◽

Temperature Range ◽

Latch Up

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Strategies for millirad sensitivity in PMOS dosimeters

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) ◽

10.1109/radecs.1997.698911 ◽

2002 ◽

Cited By ~ 2

Author(s):

C. Conneely ◽

B. O'Connell ◽

P. Hurley ◽

W. Lane ◽

L. Adams

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Energy deposited by high energy neutrons and protons in silicon (comparison between HETC and COSMIC codes)

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) ◽

10.1109/radecs.1997.698995 ◽

2002 ◽

Cited By ~ 1

Author(s):

C. Vial ◽

J.M. Palau ◽

J. Gasiot ◽

J.P. Nadai ◽

M.C. Calvet ◽

...

Keyword(s):

High Energy

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RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Latent interface-trap generation in commercial power VDMOSFETs

Investigations of single-event upsets and charge collection in micro-electronics using variable-length laser-generated charge tracks

Performance of Bragg and long-period gratings written in N- and Ge-doped silica fibers under γ-radiation

Failure mode of different irradiated power IGBT structures

MESFET destruction model and experimental validation

Total dose hardness of three commercial CMOS microelectronics foundries

Radiation damage studies of optoelectronic components for the CMS tracker optical links

Latch-up windows tests in high temperature range

Strategies for millirad sensitivity in PMOS dosimeters

Energy deposited by high energy neutrons and protons in silicon (comparison between HETC and COSMIC codes)

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RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Latent interface-trap generation in commercial power VDMOSFETs

Investigations of single-event upsets and charge collection in micro-electronics using variable-length laser-generated charge tracks

Performance of Bragg and long-period gratings written in N- and Ge-doped silica fibers under γ-radiation

Failure mode of different irradiated power IGBT structures

MESFET destruction model and experimental validation

Total dose hardness of three commercial CMOS microelectronics foundries

Radiation damage studies of optoelectronic components for the CMS tracker optical links

Latch-up windows tests in high temperature range

Strategies for millirad sensitivity in PMOS dosimeters

Energy deposited by high energy neutrons and protons in silicon (comparison between HETC and COSMIC codes)

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)
Latest Publications