Inserting test points to control peak power during scan testing

17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. ◽

10.1109/dftvs.2002.1173510 ◽

2003 ◽

Cited By ~ 27

Author(s):

R. Sankaralingam ◽

N.A. Touba

Keyword(s):

Peak Power ◽

Scan Testing ◽

Test Points

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Minimizing Peak Power Consumption during Scan Testing: Structural Technique for Don't Care Bits Assignment

2006 Ph.D. Research in Microelectronics and Electronics ◽

10.1109/rme.2006.1689897 ◽

2006 ◽

Cited By ~ 3

Author(s):

N. Badereddine ◽

P. Girard ◽

S. Pravossoudovitch ◽

C. Landrault ◽

A. Virazel ◽

...

Keyword(s):

Power Consumption ◽

Peak Power ◽

Scan Testing ◽

Peak Power Consumption

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Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives

Lecture Notes in Computer Science - Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation ◽

10.1007/11556930_55 ◽

2005 ◽

pp. 540-549

Author(s):

Nabil Badereddine ◽

Patrick Girard ◽

Arnaud Virazel ◽

Serge Pravossoudovitch ◽

Christian Landrault

Keyword(s):

Power Consumption ◽

Peak Power ◽

Test Set ◽

Scan Testing ◽

Testing Power ◽

Peak Power Consumption

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Controlling peak power during scan testing

Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) ◽

10.1109/vts.2002.1011127 ◽

2003 ◽

Cited By ~ 80

Author(s):

R. Sankaralingam ◽

N.A. Touba

Keyword(s):

Peak Power ◽

Scan Testing

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Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing

2006 IFIP International Conference on Very Large Scale Integration ◽

10.1109/vlsisoc.2006.313222 ◽

2006 ◽

Cited By ~ 15

Author(s):

N. Badereddine ◽

P. Girard ◽

S. Pravossoudovitch ◽

C. Landrault ◽

A. Virazel ◽

...

Keyword(s):

Peak Power ◽

Power Reduction ◽

Scan Testing ◽

Peak Power Reduction ◽

Don't Cares

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An Efficient Peak Power Reduction Technique for Scan Testing

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.54 ◽

2007 ◽

Cited By ~ 14

Author(s):

Meng-Fan Wu ◽

Kai-Shun Hu ◽

Jiun-Lang Huang

Keyword(s):

Peak Power ◽

Power Reduction ◽

Reduction Technique ◽

Scan Testing ◽

Peak Power Reduction

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Minimizing peak power consumption during scan testing: test pattern modification with X filling heuristics

International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. ◽

10.1109/dtis.2006.1708693 ◽

2006 ◽

Cited By ~ 24

Author(s):

N. Badereddine ◽

P. Girard ◽

S. Pravossoudovitch ◽

C. Landrault ◽

A. Virazel ◽

...

Keyword(s):

Power Consumption ◽

Peak Power ◽

Test Pattern ◽

Scan Testing ◽

Peak Power Consumption

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A Novel Technique to Reduce both Leakage and Peak Power during Scan Testing

10.1109/iciinfs.2008.4798402 ◽

2008 ◽

Cited By ~ 4

Author(s):

Subhadip Kundu ◽

Santanu Chattopadhyay ◽

Kanchan Manna

Keyword(s):

Peak Power ◽

Scan Testing ◽

Novel Technique

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An Efficient Peak Power Reduction Technique for Scan Testing

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.4387993 ◽

2007 ◽

Author(s):

Meng-Fan Wu ◽

Kai-Shun Hu ◽

Jiun-Lang Huang

Keyword(s):

Peak Power ◽

Power Reduction ◽

Reduction Technique ◽

Scan Testing ◽

Peak Power Reduction

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Peak Power Control in Multicarrier Communications

10.1017/cbo9780511618383 ◽

2007 ◽

Cited By ~ 105

Author(s):

Simon Litsyn

Keyword(s):

Power Control ◽

Peak Power ◽

Multicarrier Communications

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Maximum Peak Power Tracking-Based Control Algorithms with Stall Regulation for Optimal Wind Energy Capture

IEEJ Transactions on Industry Applications ◽

10.1541/ieejias.128.411 ◽

2008 ◽

Vol 128 (4) ◽

pp. 411-417 ◽

Cited By ~ 1

Author(s):

Bunlung Neammanee ◽

Korawit Krajangpan ◽

Somporn Sirisumrannukul ◽

Somchai Chatratana

Keyword(s):

Wind Energy ◽

Peak Power ◽

Control Algorithms ◽

Energy Capture ◽

Maximum Peak

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