An approach for detecting bridging faults in CMOS domino logic circuits using dynamic power supply current monitoring

2002 ◽  
Author(s):  
A. Walker ◽  
A.P. Henry ◽  
P.K. Lala
Keyword(s):  
Power Supply ◽  
Logic Circuits ◽  
Bridging Faults ◽  
Domino Logic ◽  
Dynamic Power ◽  
Supply Current ◽  
Current Monitoring ◽  
Dynamic Power Supply Current

scholarly journals Application of Dynamic Supply Current Monitoring to Testing Mixed-Signal Circuits

VLSI Design ◽  
1997 ◽  
Vol 5 (3) ◽  
pp. 223-240
Author(s):  
Mahmoud A. Al-Qutayri ◽  
Peter R. Shepherd
Keyword(s):  
Time Domain ◽  
Power Supply ◽  
Testing Technique ◽  
Mixed Signal ◽  
Single Fault ◽  
Mixed Signal Circuits ◽  
Supply Current ◽  
The Time Domain ◽  
Current Monitoring ◽  
Dynamic Power Supply Current

This paper applies the time-domain testing technique and compares the effectiveness of transient voltage and dynamic power supply current measurements in detecting faults in CMOS mixed-signal circuits. The voltage and supply current (iDDT) measurements are analyzed by three methods to detect the presence of a fault, and to establish which measurement achieves higher confidence in the detection. Catastrophic, soft and stuck-at single fault conditions were introduced to the circuit-under-test (CUT). The time-domain technique tests a mixed-signal CUT in a unified fashion, thereby eliminating the need to partition the CUT into separate analogue and digital modules.

scholarly journals Dynamic Power Supply Current Testing for Open Defects in CMOS SRAMs

ETRI Journal ◽  
2001 ◽  
Vol 23 (2) ◽  
pp. 77-84 ◽  
Author(s):  
Doe-Hyun Yoon Yoon ◽  
Hong-Sik Kim Kim ◽  
Sungho Kang Kang
Keyword(s):  
Power Supply ◽  
Dynamic Power ◽  
Current Testing ◽  
Supply Current ◽  
Open Defects ◽  
Dynamic Power Supply Current
Sign in / Sign up

Export Citation Format

Share Document