A statistical parametric and probe yield analysis methodology [IC manufacture]
Keyword(s):
1990 ◽
Vol 137
(4)
◽
pp. 265
◽
2019 ◽
Vol 16
(1)
◽
pp. 70-81
2019 ◽
Vol 10
(3)
◽
pp. 216-226
Keyword(s):
2017 ◽
Vol E100.A
(11)
◽
pp. 2370-2378