Fault detection in sequential circuits through functional testing

2002 ◽  
Author(s):  
G. Buonanno ◽  
F. Fummi ◽  
D. Sciuto
Keyword(s):  
Fault Detection ◽  
Sequential Circuits ◽  
Functional Testing

scholarly journals Efficient Hard Decision Fault Diagnosis using Scan Based Testing in Sequential Circuits

2019 ◽  
Vol 9 (1S6) ◽  
pp. 103-107
Keyword(s):  
Fault Detection ◽  
Digital Circuits ◽  
Detection Method ◽  
Difference Set ◽  
Sequential Circuits ◽  
Testing Time ◽  
Decision Algorithm ◽  
Area Overhead ◽  
Memory Applications ◽  
Hard Decision

Testing in sequential circuits is extremely difficult because behavior of sequential circuits depends on both the present and past value. Nowadays, in memory applications even single bit changes in digital circuits results in serious error. This paper presents a fault-detection method for difference-set test patterns with efficient hard decision algorithm using majority logic decoder/detector. This algorithm has the ability to correct large number of faults. The proposed checksum method for fault detection and correction significantly reduces testing time. This technique doesn’t require appending parity bits, which makes the area overhead minimal and keeps the extra power consumption low.

On Redundancy and Fault Detection in Sequential Circuits

1979 ◽  
Vol C-28 (11) ◽  
pp. 864-865 ◽  
Author(s):  
Abramovici ◽  
Breuer
Keyword(s):  
Fault Detection ◽  
Sequential Circuits
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