Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of input sequences using single and multiple fault detection times

I. Pomeranz; S.M. Reddy

doi:10.1109/12.995451

Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of input sequences using single and multiple fault detection times

IEEE Transactions on Computers ◽

10.1109/12.995451 ◽

2002 ◽

Vol 51 (4) ◽

pp. 409-419 ◽

Cited By ~ 1

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Fault Detection ◽

Sequential Circuits ◽

Test Sequence ◽

Multiple Fault ◽

Sequence Generation ◽

Synchronous Sequential Circuits ◽

Test Sequence Generation

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Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of test subsequences

Proceedings of the 36th ACM/IEEE conference on Design automation conference - DAC '99 ◽

10.1145/309847.310052 ◽

1999 ◽

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Sequential Circuits ◽

Test Sequence ◽

Sequence Generation ◽

Synchronous Sequential Circuits ◽

Test Sequence Generation

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Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of test subsequences

Proceedings 1999 Design Automation Conference (Cat. No. 99CH36361) ◽

10.1109/dac.1999.782115 ◽

2003 ◽

Cited By ~ 6

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Test Sequence ◽

Sequence Generation ◽

Synchronous Sequential Circuits ◽

Test Sequence Generation

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On the use of multiple fault detection times in a method for built-in test pattern generation for synchronous sequential circuits

Proceedings IEEE European Test Workshop ◽

10.1109/etw.2000.873792 ◽

2002 ◽

Cited By ~ 1

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Fault Detection ◽

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Multiple Fault ◽

Synchronous Sequential Circuits

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Test Sequence Generation for Java7 Fork/Join Using Interference Dependence

Journal on Today s Ideas-Tomorrow s Technologies ◽

10.15415/jotitt.2014.21001 ◽

2014 ◽

Vol 2 (1) ◽

pp. 1-12 ◽

Cited By ~ 1

Author(s):

Vipin Verma ◽

Vinay Arora

Keyword(s):

Test Sequence ◽

Sequence Generation ◽

Test Sequence Generation

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Safety requirement oriented test sequence generation algorithm for safety communication protocol

Journal of Computer Applications ◽

10.3724/sp.j.1087.2009.01828 ◽

2009 ◽

Vol 29 (7) ◽

pp. 1828-1831

Author(s):

Yi-qiang LI ◽

Zhong-wei XU ◽

Gang YU ◽

Yuan TAN

Keyword(s):

Communication Protocol ◽

Test Sequence ◽

Safety Requirement ◽

Safety Communication ◽

Generation Algorithm ◽

Sequence Generation ◽

Test Sequence Generation

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An Automatic Test Sequence Generation Method Based on Markov Chain Model

2021 World Conference on Computing and Communication Technologies (WCCCT) ◽

10.1109/wccct52091.2021.00024 ◽

2021 ◽

Author(s):

Liting Sun ◽

Shiwei Gao ◽

Lin Wang

Keyword(s):

Markov Chain ◽

Markov Chain Model ◽

Test Sequence ◽

Chain Model ◽

Automatic Test ◽

Sequence Generation ◽

Test Sequence Generation

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Test-sequence generation from formal requirement models

Proceedings Sixth IEEE International Symposium on High Assurance Systems Engineering. Special Topic: Impact of Networking ◽

10.1109/hase.2001.966804 ◽

2002 ◽

Cited By ~ 10

Author(s):

S. Rayadurgam ◽

M.P.E. Heimdahl

Keyword(s):

Test Sequence ◽

Sequence Generation ◽

Formal Requirement ◽

Test Sequence Generation ◽

Requirement Models

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SealTest: a simple library for test sequence generation

Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis - ISSTA 2017 ◽

10.1145/3092703.3098229 ◽

2017 ◽

Cited By ~ 1

Author(s):

Sylvain Hallé ◽

Raphaël Khoury

Keyword(s):

Test Sequence ◽

Sequence Generation ◽

Test Sequence Generation

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An improved method based on UIOv for test sequence generation

2012 IEEE 14th International Conference on Communication Technology ◽

10.1109/icct.2012.6511424 ◽

2012 ◽

Author(s):

Gu Juan ◽

Yuan Dong-ming ◽

Hu He-fei ◽

Gao Jin-chun

Keyword(s):

Test Sequence ◽

Improved Method ◽

Sequence Generation ◽

Test Sequence Generation

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Optimal test sequence generation using River Formation Dynamics

2016 International Conference System Modeling & Advancement in Research Trends (SMART) ◽

10.1109/sysmart.2016.7894483 ◽

2016 ◽

Author(s):

Yogita Khatri ◽

Abhilasha Sharma ◽

Akshi Kumar

Keyword(s):

Test Sequence ◽

Optimal Test ◽

Sequence Generation ◽

Formation Dynamics ◽

Test Sequence Generation ◽

River Formation Dynamics

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