An all-digital built-in self-test technique for transfer function characterization of RF PLLs

2011 Design, Automation & Test in Europe ◽

10.1109/date.2011.5763063 ◽

2011 ◽

Cited By ~ 1

Author(s):

Ping-Ying Wang ◽

Hsiu-Ming Chang ◽

Kwang-Ting Cheng

Keyword(s):

Transfer Function ◽

Test Technique ◽

Function Characterization ◽

Self Test ◽

Built In Self Test

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A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters

2014 IEEE 32nd VLSI Test Symposium (VTS) ◽

10.1109/vts.2014.6818750 ◽

2014 ◽

Cited By ~ 3

Author(s):

Tao Liu ◽

Chao Fu ◽

Sule Ozev ◽

Bertan Bakkaloglu

Keyword(s):

Test Technique ◽

Current Sensing ◽

Self Test ◽

Built In Self Test

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A zero aliasing built-in self test technique for delay fault testing

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) ◽

10.1109/dftvs.1999.802874 ◽

2003 ◽

Cited By ~ 3

Author(s):

Y. Tsiatouhas ◽

T. Haniotakis

Keyword(s):

Fault Testing ◽

Test Technique ◽

Delay Fault ◽

Delay Fault Testing ◽

Self Test ◽

Built In Self Test

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TU-C-224C-10: Transfer-Function Characterization of Heat Conduction in Water Calorimetry

Medical Physics ◽

10.1118/1.2241545 ◽

2006 ◽

Vol 33 (6Part16) ◽

pp. 2195-2195

Author(s):

R Tosh ◽

H Chen-Mayer

Keyword(s):

Heat Conduction ◽

Transfer Function ◽

Function Characterization

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Transfer function characterization of grazing incidence optical systems

Applied Optics ◽

10.1364/ao.27.001527 ◽

1988 ◽

Vol 27 (8) ◽

pp. 1527 ◽

Cited By ~ 30

Author(s):

James E. Harvey ◽

Edward C. Moran ◽

William P. Zmek

Keyword(s):

Transfer Function ◽

Grazing Incidence ◽

Optical Systems ◽

Function Characterization

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Characterization of a pseudo-random testing technique for analog and mixed-signal built-in-self-test

Proceedings 18th IEEE VLSI Test Symposium ◽

10.1109/vtest.2000.843851 ◽

2002 ◽

Cited By ~ 13

Author(s):

J.M. Tofte ◽

Chee-Kian Ong ◽

Jiun-Lang Huang ◽

Kwang-Ting Cheng

Keyword(s):

Random Testing ◽

Testing Technique ◽

Mixed Signal ◽

Self Test ◽

Built In Self Test

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Transfer function characterization of laser Fizeau interferometer for high-spatial-frequency phase measurements

10.1117/12.295123 ◽

1997 ◽

Cited By ~ 9

Author(s):

Erik Novak ◽

Chiayu Ai ◽

James C. Wyant

Keyword(s):

Transfer Function ◽

Spatial Frequency ◽

High Spatial Frequency ◽

Fizeau Interferometer ◽

Phase Measurements ◽

Function Characterization ◽

Frequency Phase

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Transfer Function Characterization of UWB Antennas Based on Frequency Domain Measurement

The European Conference on Wireless Technology, 2005. ◽

10.1109/ecwt.2005.1617711 ◽

2006 ◽

Cited By ~ 3

Author(s):

Yiqiong Shi ◽

S. Aditya ◽

Choi Look Law

Keyword(s):

Transfer Function ◽

Frequency Domain ◽

Uwb Antennas ◽

Function Characterization

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An implementation and analysis of a concurrent built-in self-test technique

[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers ◽

10.1109/ftcs.1988.5315 ◽

2003 ◽

Cited By ~ 26

Author(s):

R. Sharma ◽

K.K. Saluja

Keyword(s):

Test Technique ◽

Self Test ◽

Built In Self Test

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A built-in self-test technique for transmitter-only systems

2018 IEEE 36th VLSI Test Symposium (VTS) ◽

10.1109/vts.2018.8368636 ◽

2018 ◽

Author(s):

Maryam Shafiee ◽

Jennifer N. Kitchen ◽

Sule Ozev

Keyword(s):

Test Technique ◽

Self Test ◽

Built In Self Test

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Built-In-Self-Test (BIST) probing for wireless non-contact measurement and characterization of integrated circuits and systems

2011 XXXth URSI General Assembly and Scientific Symposium ◽

10.1109/ursigass.2011.6050666 ◽

2011 ◽

Author(s):

S. Wane ◽

M. Ranaivoniarivo ◽

B. Elkassir ◽

C. Kelma ◽

O. Tesson ◽

...

Keyword(s):

Integrated Circuits ◽

Contact Measurement ◽

Self Test ◽

Built In Self Test

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