2014 IEEE 32nd VLSI Test Symposium (VTS)
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75

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9

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Published By IEEE

9781479926114

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

An efficient diagnosis method to deal with multiple fault-pairs simultaneously using a single circuit model

2014 IEEE 32nd VLSI Test Symposium (VTS) ◽

10.1109/vts.2014.6818790 ◽

2014 ◽

Cited By ~ 9

Author(s):

Cheng-Hung Wu ◽

Kuen-Jong Lee ◽

Wei-Cheng Lien

Keyword(s):

Circuit Model ◽

Multiple Fault ◽

Diagnosis Method

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Test-time optimization in NOC-based manycore SOCs using multicast routing

2014 IEEE 32nd VLSI Test Symposium (VTS) ◽

10.1109/vts.2014.6818797 ◽

2014 ◽

Cited By ~ 14

Author(s):

Mukesh Agrawal ◽

Krishnendu Chakrabarty

Keyword(s):

Multicast Routing ◽

Test Time ◽

Time Optimization

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Innovative practices session 1C: Existing/emerging low power techniques

2014 IEEE 32nd VLSI Test Symposium (VTS) ◽

10.1109/vts.2014.6818744 ◽

2014 ◽

Author(s):

Charutosh Dixit ◽

Ramesh Tekumalla ◽

Wei Zhao ◽

Nilanjan Mukherjee ◽

Vivek Chickermane

Keyword(s):

Low Power

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A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters

2014 IEEE 32nd VLSI Test Symposium (VTS) ◽

10.1109/vts.2014.6818750 ◽

2014 ◽

Cited By ~ 3

Author(s):

Tao Liu ◽

Chao Fu ◽

Sule Ozev ◽

Bertan Bakkaloglu

Keyword(s):

Test Technique ◽

Current Sensing ◽

Self Test ◽

Built In Self Test

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[Title page]

2014 IEEE 32nd VLSI Test Symposium (VTS) ◽

10.1109/vts.2014.6818730 ◽

2014 ◽

Keyword(s):

Title Page

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Detection, diagnosis, and repair of faults in memristor-based memories

2014 IEEE 32nd VLSI Test Symposium (VTS) ◽

10.1109/vts.2014.6818762 ◽

2014 ◽

Cited By ~ 18

Author(s):

Sachhidh Kannan ◽

Naghmeh Karimi ◽

Ramesh Karri ◽

Ozgur Sinanoglu

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New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors

2014 IEEE 32nd VLSI Test Symposium (VTS) ◽

10.1109/vts.2014.6818777 ◽

2014 ◽

Author(s):

Bozena Kaminska ◽

Bernard Courtois ◽

Bozena Kaminska ◽

Mary Ann Maher

Keyword(s):

Design For Test ◽

Mems Sensors ◽

Topic Session ◽

Challenges And Opportunities

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Hot topic session 9C: Test and fault tolerance for emerging memory technologies

2014 IEEE 32nd VLSI Test Symposium (VTS) ◽

10.1109/vts.2014.6818788 ◽

2014 ◽

Author(s):

Suriya Natarajan ◽

Amitava Majumdar ◽

Jeyavijayan Rajendran

Keyword(s):

Fault Tolerance ◽

Topic Session ◽

Emerging Memory

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Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test

2014 IEEE 32nd VLSI Test Symposium (VTS) ◽

10.1109/vts.2014.6818781 ◽

2014 ◽

Cited By ~ 1

Author(s):

Masahiro Ishida ◽

Takahiro J. Yamaguchi ◽

Mani Soma ◽

Terri Fiez ◽

Mike Peng Li

Keyword(s):

Design For Test ◽

Analog Design ◽

Special Session

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Hot topic session 12A: Split manufacturing — IARPA's TIC program

2014 IEEE 32nd VLSI Test Symposium (VTS) ◽

10.1109/vts.2014.6818801 ◽

2014 ◽

Author(s):

Dean Collins ◽

Ramesh Karri

Keyword(s):

Topic Session

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