2018 IEEE 36th VLSI Test Symposium (VTS)
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TOTAL DOCUMENTS

58
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6
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Published By IEEE

9781538637746
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Innovative practices on functional testing and fault simulation for FuSa

2018 ◽  
Author(s):  
Anandh Krishnan ◽  
John van Gelder ◽  
Mayukh Bhattacharya ◽  
Sreejit Chakravarty ◽  
Prashant Goteti
Keyword(s):  
Fault Simulation ◽  
Functional Testing

Exploiting built-in delay lines for applying launch-on-capture at-speed testing on self-timed circuits

2018 ◽  
Author(s):  
Omar Al-Terkawi Hasib ◽  
Daniel Crepeau ◽  
Thomas Awad ◽  
Andrei Dulipovici ◽  
Yvon Savaria ◽  
...  
Keyword(s):  
Delay Lines ◽  
Timed Circuits

Innovative practices on test in Japan

2018 ◽  
Author(s):  
Koji Asami ◽  
Yoshiro Tamura ◽  
Haruo Kobayashi ◽  
Jun Matsushima ◽  
Yoichi Maeda ◽  
...  

Special session: How approximate computing impacts verification, test and reliability

2018 ◽  
Author(s):  
L. Sekanina ◽  
Z. Vasicek ◽  
A. Bosio ◽  
M. Traiola ◽  
P. Rech ◽  
...  
Keyword(s):  
Approximate Computing ◽  
Special Session ◽  
Verification Test

Innovative practices on design & test for flexible hybrid electronics

2018 ◽  
Author(s):  
Tsung-Ching Jim Huang ◽  
Jason Marsh ◽  
Scott H. Goodwin ◽  
Dorota S. Temple ◽  
Tsung-Ching Jim Huang

Hardware Trojan attacks in embedded memory

2018 ◽  
Author(s):  
Tamzidul Hoque ◽  
Xinmu Wang ◽  
Abhishek Basak ◽  
Robert Karam ◽  
Swarup Bhunia
Keyword(s):  
Hardware Trojan ◽  
Embedded Memory

Special session on BIST/calibration of A/MS devices

2018 ◽  
Author(s):  
Hans-Mart von Staudt ◽  
James Izon ◽  
Sule Ozev ◽  
Peter Sarson
Keyword(s):  
Special Session
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