High-quality pattern selection for screening small-delay defects considering process variations and crosstalk

2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) ◽

10.1109/date.2010.5457036 ◽

2010 ◽

Cited By ~ 10

Author(s):

Ke Peng ◽

Mahmut Yilmaz ◽

Mohammad Tehranipoor ◽

Krishnendu Chakrabarty

Keyword(s):

Process Variations ◽

Pattern Selection ◽

High Quality ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects

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Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700627 ◽

2008 ◽

Cited By ~ 33

Author(s):

M. Yilmaz ◽

K. Chakrabarty ◽

M. Tehranipoor

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects ◽

Test Pattern Selection

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Impact of Hazards on Pattern Selection for Small Delay Defects

2009 15th IEEE Pacific Rim International Symposium on Dependable Computing ◽

10.1109/prdc.2009.17 ◽

2009 ◽

Cited By ~ 2

Author(s):

Jie Wang ◽

Huawei Li ◽

Yinghua Min ◽

Xiaowei Li ◽

Huaguo Liang

Keyword(s):

Pattern Selection ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects

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Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2012.2205026 ◽

2013 ◽

Vol 21 (6) ◽

pp. 1129-1142 ◽

Cited By ~ 19

Author(s):

Ke Peng ◽

Mahmut Yilmaz ◽

Krishnendu Chakrabarty ◽

Mohammad Tehranipoor

Keyword(s):

Process Variations ◽

High Quality ◽

Small Delay Defects ◽

Small Delay ◽

Delay Defects

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Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2010.2043591 ◽

2010 ◽

Vol 29 (5) ◽

pp. 760-773 ◽

Cited By ~ 41

Author(s):

Mahmut Yilmaz ◽

Krishnendu Chakrabarty ◽

Mohammad Tehranipoor

Keyword(s):

Integrated Circuits ◽

Test Pattern ◽

Pattern Selection ◽

Small Delay Defects ◽

Small Delay ◽

Deep Submicrometer ◽

Selection For ◽

Delay Defects ◽

Test Pattern Selection

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Test-Pattern Grading and Pattern Selection for Small-Delay Defects

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.32 ◽

2008 ◽

Cited By ~ 51

Author(s):

Mahmut Yilmaz ◽

Krishnendu Chakrabarty ◽

Mohammad Tehranipoor

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Small Delay Defects ◽

Pattern Grading ◽

Small Delay ◽

Selection For ◽

Delay Defects

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Graph partition based path selection for testing of small delay defects

2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) ◽

10.1109/aspdac.2010.5419831 ◽

2010 ◽

Cited By ~ 1

Author(s):

Zijian He ◽

Tao Lv ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Path Selection ◽

Graph Partition ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects

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Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects

2006 15th Asian Test Symposium ◽

10.1109/ats.2006.261012 ◽

2006 ◽

Cited By ~ 95

Author(s):

Xijiang Lin ◽

Kun-han Tsai ◽

Chen Wang ◽

Mark Kassab ◽

Janusz Rajski ◽

...

Keyword(s):

High Quality ◽

Small Delay Defects ◽

Small Delay ◽

Delay Defects

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Fast path selection for testing of small delay defects considering path correlations

2010 28th VLSI Test Symposium (VTS) ◽

10.1109/vts.2010.5469628 ◽

2010 ◽

Cited By ~ 7

Author(s):

Zijian He ◽

Tao Lv ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Path Selection ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects

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High-quality transition fault atpg for small delay defects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2007.8361591 ◽

2007 ◽

Vol 26 (5) ◽

pp. 983-989 ◽

Cited By ~ 1

Author(s):

Mahilchi Milir Vaseekar Kumar ◽

Spyros Tragoudas

Keyword(s):

High Quality ◽

Small Delay Defects ◽

Small Delay ◽

Transition Fault ◽

Delay Defects

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High-Quality Transition Fault ATPG for Small Delay Defects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2006.884863 ◽

2007 ◽

Vol 26 (5) ◽

pp. 983-989 ◽

Cited By ~ 10

Author(s):

Mahilchi Milir Vaseekar Kumar ◽

Spyros Tragoudas

Keyword(s):

High Quality ◽

Small Delay Defects ◽

Small Delay ◽

Transition Fault ◽

Delay Defects

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