Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects

2006 15th Asian Test Symposium ◽

10.1109/ats.2006.261012 ◽

2006 ◽

Cited By ~ 95

Author(s):

Xijiang Lin ◽

Kun-han Tsai ◽

Chen Wang ◽

Mark Kassab ◽

Janusz Rajski ◽

...

Keyword(s):

High Quality ◽

Small Delay Defects ◽

Small Delay ◽

Delay Defects

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High-quality pattern selection for screening small-delay defects considering process variations and crosstalk

2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) ◽

10.1109/date.2010.5457036 ◽

2010 ◽

Cited By ~ 10

Author(s):

Ke Peng ◽

Mahmut Yilmaz ◽

Mohammad Tehranipoor ◽

Krishnendu Chakrabarty

Keyword(s):

Process Variations ◽

Pattern Selection ◽

High Quality ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects

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Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2012.2205026 ◽

2013 ◽

Vol 21 (6) ◽

pp. 1129-1142 ◽

Cited By ~ 19

Author(s):

Ke Peng ◽

Mahmut Yilmaz ◽

Krishnendu Chakrabarty ◽

Mohammad Tehranipoor

Keyword(s):

Process Variations ◽

High Quality ◽

Small Delay Defects ◽

Small Delay ◽

Delay Defects

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High-quality transition fault atpg for small delay defects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2007.8361591 ◽

2007 ◽

Vol 26 (5) ◽

pp. 983-989 ◽

Cited By ~ 1

Author(s):

Mahilchi Milir Vaseekar Kumar ◽

Spyros Tragoudas

Keyword(s):

High Quality ◽

Small Delay Defects ◽

Small Delay ◽

Transition Fault ◽

Delay Defects

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High-Quality Transition Fault ATPG for Small Delay Defects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2006.884863 ◽

2007 ◽

Vol 26 (5) ◽

pp. 983-989 ◽

Cited By ~ 10

Author(s):

Mahilchi Milir Vaseekar Kumar ◽

Spyros Tragoudas

Keyword(s):

High Quality ◽

Small Delay Defects ◽

Small Delay ◽

Transition Fault ◽

Delay Defects

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Tolerance to Small Delay Defects by Adaptive Clock Stretching

13th IEEE International On-Line Testing Symposium (IOLTS 2007) ◽

10.1109/iolts.2007.67 ◽

2007 ◽

Cited By ~ 4

Author(s):

Swaroop Ghosh ◽

Patrick N Dai ◽

Swarup Bhunia ◽

Kaushik Roy

Keyword(s):

Small Delay Defects ◽

Small Delay ◽

Delay Defects

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A Novel Test Generation Method for Small-Delay Defects with User-Defined Fault Model

2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2019.8741773 ◽

2019 ◽

Author(s):

Chao-Jun Shang ◽

Cheng-Hung Wu ◽

Kuen-Jong Lee ◽

Yu-Hsiang Chen

Keyword(s):

Test Generation ◽

Fault Model ◽

Small Delay Defects ◽

Small Delay ◽

Delay Defects

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Delay Test and Small-Delay Defects

Test and Diagnosis for Small-Delay Defects ◽

10.1007/978-1-4419-8297-1_2 ◽

2011 ◽

pp. 21-36 ◽

Cited By ~ 5

Author(s):

Mohammad Tehranipoor ◽

Ke Peng ◽

Krishnendu Chakrabarty

Keyword(s):

Delay Test ◽

Small Delay Defects ◽

Small Delay ◽

Delay Defects

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AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects

2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2010.48 ◽

2010 ◽

Cited By ~ 2

Author(s):

Tsung-Yeh Li ◽

Shi-Yu Huang ◽

Hsuan-Jung Hsu ◽

Chao-Wen Tzeng ◽

Chih-Tsun Huang ◽

...

Keyword(s):

Test Methodology ◽

Small Delay Defects ◽

Scan Test ◽

Small Delay ◽

Frequency Scan ◽

Delay Defects

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Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700627 ◽

2008 ◽

Cited By ~ 33

Author(s):

M. Yilmaz ◽

K. Chakrabarty ◽

M. Tehranipoor

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects ◽

Test Pattern Selection

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Graph partition based path selection for testing of small delay defects

2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) ◽

10.1109/aspdac.2010.5419831 ◽

2010 ◽

Cited By ~ 1

Author(s):

Zijian He ◽

Tao Lv ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Path Selection ◽

Graph Partition ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects

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