SoC Testing Using LFSR Reseeding, and Scan-Slice- Based TAM Optimization and Test Scheduling
2009 ◽
Vol 28
(8)
◽
pp. 1251-1264
◽
2005 ◽
Vol 24
(6)
◽
pp. 956-965
◽
2009 ◽
Vol 2009
(10)
◽
pp. 55-61
Keyword(s):
Keyword(s):