Optimal on-line built-in self-test structure for system-reliability improvement

2011 IEEE Congress of Evolutionary Computation (CEC) ◽

10.1109/cec.2011.5949622 ◽

2011 ◽

Cited By ~ 4

Author(s):

Gregor Papa ◽

Tomasz Garbolino

Keyword(s):

System Reliability ◽

Test Structure ◽

Reliability Improvement ◽

On Line ◽

Self Test ◽

Built In Self Test

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On-line RF built-in self-test using noise injection and transmitter signal modulation by phase shifter

2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) ◽

10.23919/date.2018.8342157 ◽

2018 ◽

Author(s):

Jan Schat

Keyword(s):

Phase Shifter ◽

Signal Modulation ◽

Noise Injection ◽

On Line ◽

Self Test ◽

Built In Self Test

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A digital partial built-in self-test structure for a high performance automatic gain control circuit

Proceedings of the conference on Design, automation and test in Europe - DATE '99 ◽

10.1145/307418.307496 ◽

1999 ◽

Author(s):

A. Lechner ◽

J. Ferguson ◽

A. Richardson ◽

B. Hermes

Keyword(s):

High Performance ◽

Automatic Gain Control ◽

Gain Control ◽

Control Circuit ◽

Test Structure ◽

Self Test ◽

Built In Self Test

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A built-in self-test structure for arithmetic execution units of VLSIs

Electronics and Communications in Japan (Part II Electronics) ◽

10.1002/ecjb.4420780407 ◽

1995 ◽

Vol 78 (4) ◽

pp. 68-78

Author(s):

Takeshi Ikenaga ◽

Jun-Ichi Takahashi

Keyword(s):

Test Structure ◽

Self Test ◽

Built In Self Test

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A Transient Fault Tolerant Test Pattern Generator for On-line Built-in Self-Test

2013 22nd Asian Test Symposium ◽

10.1109/ats.2013.24 ◽

2013 ◽

Author(s):

Yuki Fukazawa ◽

Tsuyoshi Iwagaki ◽

Hideyuki Ichihara ◽

Tomoo Inoue

Keyword(s):

Test Pattern ◽

Fault Tolerant ◽

Pattern Generator ◽

Transient Fault ◽

On Line ◽

Self Test ◽

Built In Self Test

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Efficient techniques for reducing error latency in on-line periodic built-in self-test

IEEE Instrumentation & Measurement Magazine ◽

10.1109/mim.2010.5521863 ◽

2010 ◽

Vol 13 (4) ◽

pp. 28-32 ◽

Cited By ~ 5

Author(s):

Hussain Al-Asaad

Keyword(s):

On Line ◽

Self Test ◽

Built In Self Test ◽

Error Latency

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A Built-In Self-Test Structure (BIST) for Resistive RAMs characterization: Application to bipolar OxRRAM

Solid-State Electronics ◽

10.1016/j.sse.2014.09.005 ◽

2015 ◽

Vol 103 ◽

pp. 73-78 ◽

Cited By ~ 2

Author(s):

H. Aziza ◽

M. Bocquet ◽

M. Moreau ◽

J-M. Portal

Keyword(s):

Test Structure ◽

Self Test ◽

Built In Self Test

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On-line built-in self-test for operational faults

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) ◽

10.1109/autest.2000.885585 ◽

2002 ◽

Cited By ~ 9

Author(s):

H. Al-Asaad ◽

M. Shringi

Keyword(s):

On Line ◽

Self Test ◽

Built In Self Test

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A Built-In Self-Test structure for measuring gain and 1-dB compression point of Power Amplifier

AEU - International Journal of Electronics and Communications ◽

10.1016/j.aeue.2018.01.019 ◽

2018 ◽

Vol 86 ◽

pp. 47-54

Author(s):

Mehdi Ehsanian ◽

Masoud Askari-Raad

Keyword(s):

Power Amplifier ◽

Test Structure ◽

Self Test ◽

Built In Self Test

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CA Based Built-In Self-Test Structure for SoC

2009 Asian Test Symposium ◽

10.1109/ats.2009.71 ◽

2009 ◽

Author(s):

Sukanta Das ◽

Biplab K. Sikdar

Keyword(s):

Test Structure ◽

Self Test ◽

Built In Self Test

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Built-in self-test structure for mixed-mode circuits

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/19.206674 ◽

1993 ◽

Vol 42 (1) ◽

pp. 25-29 ◽

Cited By ~ 34

Author(s):

L.T. Wurtz

Keyword(s):

Mixed Mode ◽

Test Structure ◽

Self Test ◽

Built In Self Test

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