A built-in self-test structure for arithmetic execution units of VLSIs

Takeshi Ikenaga; Jun-Ichi Takahashi

doi:10.1002/ecjb.4420780407

A built-in self-test structure for arithmetic execution units of VLSIs

Electronics and Communications in Japan (Part II Electronics) ◽

10.1002/ecjb.4420780407 ◽

1995 ◽

Vol 78 (4) ◽

pp. 68-78

Author(s):

Takeshi Ikenaga ◽

Jun-Ichi Takahashi

Keyword(s):

Test Structure ◽

Self Test ◽

Built In Self Test

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A digital partial built-in self-test structure for a high performance automatic gain control circuit

Proceedings of the conference on Design, automation and test in Europe - DATE '99 ◽

10.1145/307418.307496 ◽

1999 ◽

Author(s):

A. Lechner ◽

J. Ferguson ◽

A. Richardson ◽

B. Hermes

Keyword(s):

High Performance ◽

Automatic Gain Control ◽

Gain Control ◽

Control Circuit ◽

Test Structure ◽

Self Test ◽

Built In Self Test

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A Built-In Self-Test Structure (BIST) for Resistive RAMs characterization: Application to bipolar OxRRAM

Solid-State Electronics ◽

10.1016/j.sse.2014.09.005 ◽

2015 ◽

Vol 103 ◽

pp. 73-78 ◽

Cited By ~ 2

Author(s):

H. Aziza ◽

M. Bocquet ◽

M. Moreau ◽

J-M. Portal

Keyword(s):

Test Structure ◽

Self Test ◽

Built In Self Test

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A Built-In Self-Test structure for measuring gain and 1-dB compression point of Power Amplifier

AEU - International Journal of Electronics and Communications ◽

10.1016/j.aeue.2018.01.019 ◽

2018 ◽

Vol 86 ◽

pp. 47-54

Author(s):

Mehdi Ehsanian ◽

Masoud Askari-Raad

Keyword(s):

Power Amplifier ◽

Test Structure ◽

Self Test ◽

Built In Self Test

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Optimal on-line built-in self-test structure for system-reliability improvement

2011 IEEE Congress of Evolutionary Computation (CEC) ◽

10.1109/cec.2011.5949622 ◽

2011 ◽

Cited By ~ 4

Author(s):

Gregor Papa ◽

Tomasz Garbolino

Keyword(s):

System Reliability ◽

Test Structure ◽

Reliability Improvement ◽

On Line ◽

Self Test ◽

Built In Self Test

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CA Based Built-In Self-Test Structure for SoC

2009 Asian Test Symposium ◽

10.1109/ats.2009.71 ◽

2009 ◽

Author(s):

Sukanta Das ◽

Biplab K. Sikdar

Keyword(s):

Test Structure ◽

Self Test ◽

Built In Self Test

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Built-in self-test structure for mixed-mode circuits

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/19.206674 ◽

1993 ◽

Vol 42 (1) ◽

pp. 25-29 ◽

Cited By ~ 34

Author(s):

L.T. Wurtz

Keyword(s):

Mixed Mode ◽

Test Structure ◽

Self Test ◽

Built In Self Test

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GF(2/sup p/) cellular automata as a built in self test structure

Proceedings of the ASP-DAC 2001. Asia and South Pacific Design Automation Conference 2001 (Cat. No.01EX455) ◽

10.1109/aspdac.2001.913326 ◽

2002 ◽

Author(s):

B.K. Sikdar ◽

D.K. Das ◽

V. Boppana ◽

C. Yang ◽

S. Mukherjee ◽

...

Keyword(s):

Cellular Automata ◽

Test Structure ◽

Self Test ◽

Built In Self Test

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Cellular automata as a built in self test structure

Proceedings of the 2001 conference on Asia South Pacific design automation - ASP-DAC '01 ◽

10.1145/370155.370367 ◽

2001 ◽

Cited By ~ 2

Author(s):

Biplab K. Sikdar ◽

Debesh K. Das ◽

Vamsi Boppana ◽

Cliff Yang ◽

Sobhan Mukherjee ◽

...

Keyword(s):

Cellular Automata ◽

Test Structure ◽

Self Test ◽

Built In Self Test

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A digital partial built-in self-test structure for a high performance automatic gain control circuit

Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078) ◽

10.1109/date.1999.761127 ◽

2003 ◽

Author(s):

A. Lechner ◽

J. Ferguson ◽

A. Richardson ◽

B. Hermes

Keyword(s):

High Performance ◽

Automatic Gain Control ◽

Gain Control ◽

Control Circuit ◽

Test Structure ◽

Self Test ◽

Built In Self Test

Download Full-text

A novel built-in-self test structure for analog circuits with application to filters

Thirteenth National Radio Science Conference. NRSC '96 ◽

10.1109/nrsc.1996.551128 ◽

2002 ◽

Author(s):

F.Z. Amer

Keyword(s):

Analog Circuits ◽

Test Structure ◽

Self Test ◽

Built In Self Test

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