Functional Verification of Radio Frequency SoCs using Mixed-Mode and Mixed-Domain Simulations

Author(s):  
Stefan Joeres ◽  
Stefan Heinen
Author(s):  
Cha-Ming Shen ◽  
Yen-Long Chang ◽  
Lian-Fon Wen ◽  
Tan-Chen Chuang ◽  
Shi-Chen Lin ◽  
...  

Abstract Highly-integrated radio frequency and mixed-mode devices that are manufactured in deep-submicron or more advanced CMOS processes are becoming more complex to analyze. The increased complexity presents us with many eccentric failure mechanisms that are uniquely different from traditional failure mechanisms found during failure analysis on digital logic applications. This paper presents a novel methodology to overcome the difficulties and discusses two case studies which demonstrate the application of the methodology. Through the case studies, the methodology was proven to be a successful approach. It is also proved how this methodology would work for such non-recognizable failures.


2006 ◽  
Vol 175 (4S) ◽  
pp. 16-16 ◽  
Author(s):  
Joshua M. Stern ◽  
Robert S. Svatek ◽  
Sangtae Park ◽  
J. Kyle Anderson ◽  
Yair Lotan ◽  
...  

2004 ◽  
Vol 171 (4S) ◽  
pp. 505-505
Author(s):  
Edward D. Matsumoto ◽  
Lori Watumall ◽  
D. Brooke Johnson ◽  
Kenneth Ogan ◽  
Grant D. Taylor ◽  
...  

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