Challenges in Next Generation Mixed-Signal IC Production Testing

2005 ◽  
Author(s):  
S. Cherubal
Keyword(s):  
Production Testing ◽  
Next Generation ◽  
Mixed Signal ◽  
Mixed Signal Ic

Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing

2019 ◽  
Author(s):  
Yukiko Shibasaki ◽  
Koji Asami ◽  
Anna Kuwana ◽  
Kosuke Machida ◽  
Yuanyang Du ◽  
...  
Keyword(s):  
Crest Factor ◽  
Mixed Signal ◽  
Ic Testing ◽  
Mixed Signal Ic

Fast Digital to Analog Convertor using Spatial Wave Switched FETs

2014 ◽  
Vol 23 (01n02) ◽  
pp. 1450002
Author(s):  
Pawan Gogna ◽  
Murali Lingalugari ◽  
John Chandy ◽  
Evan Heller ◽  
Faquir Jain
Keyword(s):  
Analog To Digital Converters ◽  
Multiple Channels ◽  
Next Generation ◽  
Single Cycle ◽  
Mixed Signal ◽  
Analog To Digital ◽  
Digital To Analog

In this paper, we are presenting fast digital to analog convertor designs using Spatial Waveform Switched FETs (SWSFET). SWSFET was introduced by Jain et.al. These FETs have multiple channels stacked vertically. The Carrier wavefunction switches from one channel to another with the application of different gate voltages. Designs of multi-bit SRAM, logic and sequential cells using SWSFETs have been demonstrated. Here we are introducing the use of SWSFET in mixed signal architectures. Single cycle architectures for two-bit, four-bit and eight-bit analog to digital converters are presented. Four bit architecture has been simulated and results are discussed. SWSFET presents the opportunity with its multiple stacked channel features to extend the Moors law using next generation of devices.

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