Substrate modeling and parameter extraction for the small-signal equivalent circuit of a RF silicon MOSFET

Author(s):  
Seonghearn Lee ◽  
Cheon Soo Kim ◽  
Hyun Kyu Yu
2015 ◽  
Vol 85 (3) ◽  
pp. 405-411 ◽  
Author(s):  
Zhang Jincan ◽  
Liu Bo ◽  
Zhang Leiming ◽  
Sun Ligong ◽  
Wang Jinchan ◽  
...  

IEEE Access ◽  
2019 ◽  
Vol 7 ◽  
pp. 5865-5873
Author(s):  
Yabin Sun ◽  
Ziyu Liu ◽  
Xiaojin Li ◽  
Yanling Shi

Circuit World ◽  
2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Jincan Zhang ◽  
Min Liu ◽  
Jinchan Wang ◽  
Kun Xu

Purpose High-speed Indium Phosphide (InP) HBTs have been widely used to design high-speed analog, digital and mixed-signal integrated circuits. The purpose of this study is to propose a new parameter extraction procedure for determining an improved T-topology small-signal equivalent circuit of InP heterojunction bipolar transistors (HBTs). Design/methodology/approach The alternating current crowding effect is considered through adding the intrinsic base capacitance in the small-signal equivalent circuit. All of the circuit parameters are extracted directly without using any approximation. Findings The extraction technique is more easily understood and clearer than other extraction methods, as the equations are derived from the S-parameters by peeling peripheral elements from small-signal models to get reduced ones and extracting each equivalent-circuit parameter using each equation. Originality/value To validate the presented parameter extraction technology, an n-p-n emitter-up InP HBT was analyzed adopting the method. Excellent agreement between measured and modeled S-parameters is obtained up to 40 GHz.


IEEE Access ◽  
2018 ◽  
Vol 6 ◽  
pp. 19752-19761 ◽  
Author(s):  
Muyang Qin ◽  
Yabin Sun ◽  
Xiaojin Li ◽  
Yanling Shi

2016 ◽  
Vol 94 ◽  
pp. 223-230
Author(s):  
Yabin Sun ◽  
Jun Fu ◽  
Yudong Wang ◽  
Wei Zhou ◽  
Wei Zhang ◽  
...  

2007 ◽  
Vol 49 (8) ◽  
pp. 1845-1848
Author(s):  
Sung-Jin Ho ◽  
Min Ki Choi ◽  
Daniel W. van der Weide

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