Integrated circuit testing for quality assurance in manufacturing: history, current status, and future trends

Author(s):  
A. Grochowski ◽  
D. Bhattacharya ◽  
T.R. Viswanathan ◽  
K. Laker
1999 ◽  
Author(s):  
Theodore R. Hoelter ◽  
Blake A. Henry ◽  
John H. Graff ◽  
Naseem Y. Aziz

Sign in / Sign up

Export Citation Format

Share Document