Dynamic digital integrated circuit testing using oscillation-test method

K. Arabi; H. Ihs; C. Dufaza; B. Kaminska

doi:10.1049/el:19980529

Dynamic digital integrated circuit testing using oscillation-test method

Electronics Letters ◽

10.1049/el:19980529 ◽

1998 ◽

Vol 34 (8) ◽

pp. 762 ◽

Cited By ~ 20

Author(s):

K. Arabi ◽

H. Ihs ◽

C. Dufaza ◽

B. Kaminska

Keyword(s):

Integrated Circuit ◽

Test Method ◽

Circuit Testing ◽

Integrated Circuit Testing ◽

Oscillation Test ◽

Digital Integrated Circuit

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Digital integrated circuit testing for art historians and test experts

IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. ◽

10.1109/iccd.2004.1347889 ◽

2004 ◽

Author(s):

E. McCluskey

Keyword(s):

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing ◽

Art Historians ◽

Digital Integrated Circuit

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Digital integrated circuit testing using transient signal analysis

Proceedings International Test Conference 1996. Test and Design Validity ◽

10.1109/test.1996.557062 ◽

2002 ◽

Cited By ~ 30

Author(s):

J.F. Plusquellic ◽

D.M. Chiarulli ◽

S.P. Levitan

Keyword(s):

Integrated Circuit ◽

Signal Analysis ◽

Transient Signal ◽

Circuit Testing ◽

Integrated Circuit Testing ◽

Digital Integrated Circuit

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The concept of proper operation region in digital integrated circuit testing, the 8080A microprocessor as an example

Microprocessing and Microprogramming ◽

10.1016/0165-6074(83)90208-9 ◽

1983 ◽

Vol 12 (5) ◽

pp. 285-290

Author(s):

Bożena Kaminska ◽

Jan Zabrodzki

Keyword(s):

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing ◽

Proper Operation ◽

Digital Integrated Circuit

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Digital integrated circuit testing from a quality perspective

Microelectronics Journal ◽

10.1016/0026-2692(94)90115-5 ◽

1994 ◽

Vol 25 (2) ◽

pp. 140-141

Author(s):

Z. Nikolić

Keyword(s):

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing ◽

Digital Integrated Circuit

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Digital integrated circuit testing from a quality persepctive

Microelectronics Reliability ◽

10.1016/0026-2714(94)90057-4 ◽

1994 ◽

Vol 34 (10) ◽

pp. 1697-1698

Author(s):

Z. Nikolić

Keyword(s):

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing ◽

Digital Integrated Circuit

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Digital integrated circuit testing from a quality perspective

Microelectronics Reliability ◽

10.1016/0026-2714(94)90496-0 ◽

1994 ◽

Vol 34 (1) ◽

pp. 194-195

Author(s):

G.W.A.D.

Keyword(s):

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing ◽

Digital Integrated Circuit

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Integrated circuit testing at Texas Instruments Limited. Automatic testing cuts cost of quality control

Microelectronics Reliability ◽

10.1016/0026-2714(70)90602-5 ◽

1970 ◽

Vol 9 (2) ◽

pp. 116

Keyword(s):

Quality Control ◽

Integrated Circuit ◽

Automatic Testing ◽

Circuit Testing ◽

Cost Of Quality ◽

Integrated Circuit Testing

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Time-Domain Measurements for Silicon Integrated Circuit Testing Using Photoconductors

Picosecond Electronics and Optoelectronics ◽

10.1007/978-3-642-70780-3_12 ◽

1985 ◽

pp. 66-69 ◽

Cited By ~ 1

Author(s):

W. R. Eisenstadt ◽

R. B. Hammond ◽

D. R. Bowman ◽

R. W. Dutton

Keyword(s):

Time Domain ◽

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing

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INTEGRATED CIRCUIT TESTING AND ANALYSIS

Handbook of Quality Integrated Circuit Manufacturing ◽

10.1016/b978-0-12-781870-2.50015-4 ◽

1991 ◽

pp. 415-463

Author(s):

ROBERT ZORICH

Keyword(s):

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing

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MIRAGE read-in integrated circuit testing results

10.1117/12.352896 ◽

1999 ◽

Author(s):

Theodore R. Hoelter ◽

Blake A. Henry ◽

John H. Graff ◽

Naseem Y. Aziz

Keyword(s):

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing

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