Microelectronics Failure Analysis
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Published By ASM International

9781627082471
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Electronics and Failure Analysis[1]

2019 ◽  
pp. 613-633
Author(s):  
Jerry Soden ◽  
Jaume Segura ◽  
Charles F. Hawkins
Keyword(s):  
Failure Analysis

FIB Overview

2019 ◽  
pp. 335-350
Author(s):  
Chris Park ◽  
Amir Avishai ◽  
David Pan ◽  
Brett Lewis ◽  
Alex Buxbaum

Silicon Device Backside De-Processing and Fault Isolation Techniques

2019 ◽  
pp. 323-334
Author(s):  
Xianghong Tom Tong ◽  
Wen-hsien Chuang ◽  
Hyuk Ju Ryu ◽  
Prasoon Joshi ◽  
Di Xu ◽  
...  
Keyword(s):  
Fault Isolation ◽  
Isolation Techniques ◽  
Silicon Device

The Fundamentals of Nanoprobe Analysis

2019 ◽  
pp. 285-322
Author(s):  
Randal Mulder ◽  
Kent Erington
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