High-Tc Josephson junctions on micro V-shape groove prepared by focused ion beam

1999 ◽  
Vol 9 (2) ◽  
pp. 2878-2881 ◽  
Author(s):  
N. Yutani ◽  
K. Suzuki ◽  
Y. Enomoto
Keyword(s):  
Josephson Junctions ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
High Tc

PLANAR JOSEPHSON JUNCTIONS FABRICATED BY FOCUSED-ION BEAM

2001 ◽  
Vol 15 (24n25) ◽  
pp. 3359-3360 ◽  
Author(s):  
Hye-Won Seo ◽  
Quark Y. Chen ◽  
Chong Wang ◽  
Wei-Kan Chu ◽  
T. M. Chuang ◽  
...  
Keyword(s):  
Silicon Dioxide ◽  
Josephson Junctions ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Spot Size ◽  
Physical Significance ◽  
Fabrication Technique ◽  
Beam Spot ◽  
Beam Spot Size ◽  
Current Voltage

We have fabricated nano-scaled planar superconductor-insulator-superconductor Josephson junctions using focused ion beam (FIB) with beam spot size ~5 nm . To study the effectiveness of this fabrication technique and for the purpose of comparisons, a variety of samples have been made based on high temperature superconducting (HTS) YBa2Cu3O7-δ electrodes. The insulators are either vacuum or silicon dioxide. The samples showed current-voltage (IV) characteristics typical of a resistively shunted junction (RSJ). We will discuss various aspects of the processing methods and the physical significance of the junction characteristics.

scholarly journals Effect of Gallium Focused Ion Beam Irradiation on Properties of YBa2Cu3Ox/La0.67Sr0.33MnO3 Heterostructures

2011 ◽  
Vol 62 (2) ◽  
pp. 109-113 ◽  
Author(s):  
Vladimír Štrbík ◽  
Štefan Beňačka ◽  
Štefan Gaži ◽  
Vasilij Šmatko ◽  
Štefan Chromik ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Weak Link ◽  
Ion Beam ◽  
Superconducting Properties ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Film Properties ◽  
High Tc ◽  
Nanometer Size ◽  
Fib Patterning

Effect of Gallium Focused Ion Beam Irradiation on Properties of YBa2Cu3Ox/La0.67Sr0.33MnO3 Heterostructures We present initial investigation of the superconductor-ferromagnet-superconductor (SFS) heterostructures of nanometer dimensions prepared by the gallium focused ion beam (FIB) technology. The SFS heterostructures were realized on the basis of high-Tc superconducting YBa2Cu3Ox and ferromagnetic La0.67Sr0.33MnO3 thin films. SFS weak link junctions require dimensions of the weak link connection in the range of nanometer size realizable by FIB patterning. On the other side the gallium focused ion beam might bring about unacceptable degradation of the superconducting as well as ferromagnetic thin film properties. The presented results show that FIB offers a suitable procedure for realization of nanometer size devices but some degradation of the ferromagnetic and superconducting properties was observed. Solution of this problem will be achieved in the next stage of our investigations.

Fabrication of high Ic×Rn YBCO-Josephson-junctions on MgO- substrates using a focused-ion-beam system

1993 ◽  
Vol 210 (1-2) ◽  
pp. 138-146 ◽  
Author(s):  
Ch. Neumann ◽  
K. Yamaguchi ◽  
K. Hayashi ◽  
K. Suzuki ◽  
Y. Enomoto ◽  
...  
Keyword(s):  
Josephson Junctions ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam System

Josephson junctions fabricated by focused ion beam from ex situ grown MgB2 thin films

2004 ◽  
Vol 405 (1) ◽  
pp. 84-88 ◽  
Author(s):  
A Malisa ◽  
M Valkeapää ◽  
L.-G Johansson ◽  
Zdravko Ivanov
Keyword(s):  
Thin Films ◽  
Josephson Junctions ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Ex Situ ◽  
Mgb2 Thin Films

Focused ion beam fabrication and properties of nanoscale Josephson junctions for sensors and other applications

2005 ◽  
Vol 2 (5) ◽  
pp. 1455-1462 ◽  
Author(s):  
M. G. Blamire ◽  
C. Bell ◽  
G. Burnell ◽  
D.-J. Kang ◽  
A. Ruotolo ◽  
...  
Keyword(s):  
Josephson Junctions ◽  
Focused Ion Beam ◽  
Ion Beam
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