Tunable microwave components based on dielectric nonlinearity by using HTS/ferroelectric thin films

1995 ◽  
Vol 5 (4) ◽  
pp. 3511-3517 ◽  
Author(s):  
F. Abbas ◽  
L.E. Davis ◽  
J.C. Gallop
Keyword(s):  
Thin Films ◽  
Ferroelectric Thin Films ◽  
Dielectric Nonlinearity ◽  
Microwave Components ◽  
Tunable Microwave

HTS/ferroelectric thin films for tunable microwave components

1995 ◽  
Vol 5 (2) ◽  
pp. 3191-3194 ◽  
Author(s):  
F.A. Miranda ◽  
C.H. Mueller ◽  
C.D. Cubbage ◽  
K.B. Bhasin ◽  
R.K. Singh ◽  
...  
Keyword(s):  
Thin Films ◽  
Ferroelectric Thin Films ◽  
Microwave Components ◽  
Tunable Microwave

Evaluation of Ferroelectric BaxSr1−xTiO3 Thin Films Driven by Phase Shifters for Reflectarray Applications

2000 ◽  
Vol 656 ◽  
Author(s):  
F. A. Miranda ◽  
C. H. Mueller ◽  
F. W. Van Keuls ◽  
R. R. Romanofsky
Keyword(s):  
Thin Films ◽  
Phase Shifters ◽  
Ferroelectric Thin Films ◽  
Performance Criteria ◽  
Evaluation Methodology ◽  
X Ray Diffraction ◽  
Subsequent Performance ◽  
Microwave Components ◽  
Tunable Microwave ◽  
Rf Performance

ABSTRACTThe application of ferroelectric thin films for the development of frequency and phase agile microwave components has been the reason behind very encouraging demonstrations of tunable microwave devices in recent years. Thus, one could conclude with basically a general consensus, that the question of the suitability of thin film ferroelectric technology for the fabrication of superior tunable microwave components has been already answered in a favorable way. However, what is still pending in regards to the validation of this technology is the development of evaluation methodologies to set forth the standards for the material quality and subsequent performance criteria of specific components and devices based on this technology. In this paper we discuss the evaluation methodology under implementation at NASA Glenn Research Center aimed at identifying and optimizing the most relevant parameters of BaxSr1−xTiO3 (BSTO) ferroelectric thin films (i.e., tunability, losses, thickness, crystalline quality, etc.) as defined by a specific microwave application (in our case, phase shifters for reflectarray antennas). Results of our material analysis based on X-ray diffraction and ellipsometry, and how these properties correlate with RF performance for a targeted circuit, will be presented.

KTN ferroelectric thin-films: Application to the realization of tunable microwave devices

2006 ◽  
Author(s):  
Vincent Laur ◽  
Arnaud Moussavou ◽  
Anthony Rousseau ◽  
Gerard Tanne ◽  
Paul Laurent ◽  
...  
Keyword(s):  
Thin Films ◽  
Ferroelectric Thin Films ◽  
Microwave Devices ◽  
Tunable Microwave

scholarly journals Characterization of Acoustic Effects in Ferroelectric Thin-Films for Microwave Components

Frequenz ◽  
2008 ◽  
Vol 62 (3-4) ◽  
Author(s):  
A. Giere ◽  
R. Schafranek ◽  
Y. Zheng ◽  
H. Maune ◽  
M. Sazegar ◽  
...  
Keyword(s):  
Thin Films ◽  
Ferroelectric Thin Films ◽  
Microwave Components
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