500-GHz characterization of an optoelectronic S-parameter test structure

1994 ◽  
Vol 4 (4) ◽  
pp. 118-120 ◽  
Author(s):  
M.Y. Frankel
Keyword(s):  
Test Structure ◽  
S Parameter ◽  
Parameter Test

scholarly journals Single Step 2-Port Device De-Embedding Algorithm for Fixture-DUT-Fixture Network Assembly

Electronics ◽  
2021 ◽  
Vol 10 (11) ◽  
pp. 1275
Author(s):  
Simone Scafati ◽  
Enza Pellegrino ◽  
Francesco de Paulis ◽  
Carlo Olivieri ◽  
James Drewniak ◽  
...  
Keyword(s):  
Standard Technique ◽  
Single Step ◽  
Scattering Parameters ◽  
Linear Set ◽  
S Parameter ◽  
Parameter Conversion ◽  
Before And After ◽  
One Step ◽  
Typical Measurement

The de-embedding of measurement fixtures is relevant for an accurate experimental characterization of radio frequency and digital electronic devices. The standard technique consists in removing the effects of the measurement fixtures by the calculation of the transfer scattering parameters (T-parameters) from the available measured (or simulated) global scattering parameters (S-parameters). The standard de-embedding is achieved by a multiple steps process, involving the S-to-T and subsequent T-to-S parameter conversion. In a typical measurement setup, two fixtures are usually placed before and after the device under test (DUT) allowing the connection of the device to the calibrated vector network analyzer coaxial ports. An alternative method is proposed in this paper: it is based on the newly developed multi-network cascading algorithm. The matrices involved in the fixture-DUT-fixture cascading gives rise to a non-linear set of equations that is in one step analytically solved in closed form, obtaining a unique solution. The method is shown to be effective and at least as accurate as the standard multi-step de-embedding one.

On the choice of the test structure for the electrical characterization of dielectrics for silicon solar cells

2010 ◽  
Vol 4 (12) ◽  
pp. 362-364 ◽  
Author(s):  
X. Loozen ◽  
B. J. O'Sullivan ◽  
A. Rothschild ◽  
B. Vermang ◽  
J. John ◽  
...  
Keyword(s):  
Solar Cells ◽  
Electrical Characterization ◽  
Test Structure ◽  
Silicon Solar Cells
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