Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002.
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Verification structures for transmission line pulse measurements

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. ◽

10.1109/icmts.2002.1193191 ◽

2003 ◽

Author(s):

R.A. Ashton

Keyword(s):

Transmission Line ◽

Pulse Measurements

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A combined R/sub G//C/sub F/ large-signal extraction methodology to improve CMOS SPICE-parameter precision

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. ◽

10.1109/icmts.2002.1193181 ◽

2003 ◽

Author(s):

S. Mecking ◽

A. Korbel ◽

E. Paparisto ◽

U. Langmann

Keyword(s):

Signal Extraction ◽

Large Signal ◽

Parameter Precision

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Design and characterisation of a high precision resistor ladder test structure

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. ◽

10.1109/icmts.2002.1193200 ◽

2003 ◽

Cited By ~ 4

Author(s):

H.P. Tuinhout ◽

G. Hoogzaad ◽

M. Vertregt ◽

R.L.J. Roovers ◽

C. Erdmann

Keyword(s):

High Precision ◽

Test Structure

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Wafer-level characterization of EEPROM tunnel oxide using a fast floating-gate technique and a realistic memory cell-based test structure

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. ◽

10.1109/icmts.2002.1193187 ◽

2003 ◽

Author(s):

S. Renard ◽

P. Boivin ◽

J.L. Autran

Keyword(s):

Memory Cell ◽

Test Structure ◽

Floating Gate ◽

Wafer Level

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Strategies and test structures for improving isolation between circuit blocks

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. ◽

10.1109/icmts.2002.1193177 ◽

2003 ◽

Cited By ~ 6

Author(s):

D. Szmyd ◽

L. Gambus ◽

A. Wilbanks

Keyword(s):

Circuit Blocks

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A new test structure and characterization methodology to identify array leakage path in Mask ROM

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. ◽

10.1109/icmts.2002.1193169 ◽

2003 ◽

Cited By ~ 1

Author(s):

T. Fan ◽

K.Y. Chan ◽

T.C. Lu ◽

S. Pan

Keyword(s):

Test Structure ◽

Leakage Path

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Test structures for a MEMS SiO/sub x//metal process

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. ◽

10.1109/icmts.2002.1193197 ◽

2003 ◽

Author(s):

M. Hill ◽

C. O'Mahony ◽

P.J. Hughes ◽

B. Lane ◽

A. Mathewson

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New spider-webs test structure and characterization methodology for flash memory tunnel oxide quality

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. ◽

10.1109/icmts.2002.1193185 ◽

2003 ◽

Author(s):

T.H. Fan ◽

T.C. Lu ◽

S. Pan

Keyword(s):

Flash Memory ◽

Test Structure ◽

Spider Webs

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Electrical CD characterisation of binary and alternating aperture phase shifting masks

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. ◽

10.1109/icmts.2002.1193162 ◽

2003 ◽

Cited By ~ 11

Author(s):

S. Smith ◽

M. McCallum ◽

A.J. Walton ◽

J.T.M. Stevenson

Keyword(s):

Phase Shifting

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A comparison of extraction techniques for threshold voltage mismatch

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. ◽

10.1109/icmts.2002.1193202 ◽

2003 ◽

Cited By ~ 27

Author(s):

J.A. Croon ◽

H.P. Tuinhout ◽

R. Difrenza ◽

J. Knol ◽

A.J. Moonen ◽

...

Keyword(s):

Threshold Voltage ◽

Extraction Techniques

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Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002.Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Verification structures for transmission line pulse measurements

A combined R/sub G//C/sub F/ large-signal extraction methodology to improve CMOS SPICE-parameter precision

Design and characterisation of a high precision resistor ladder test structure

Wafer-level characterization of EEPROM tunnel oxide using a fast floating-gate technique and a realistic memory cell-based test structure

Strategies and test structures for improving isolation between circuit blocks

A new test structure and characterization methodology to identify array leakage path in Mask ROM

Test structures for a MEMS SiO/sub x//metal process

New spider-webs test structure and characterization methodology for flash memory tunnel oxide quality

Electrical CD characterisation of binary and alternating aperture phase shifting masks

A comparison of extraction techniques for threshold voltage mismatch

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002.
Latest Publications