scholarly journals Effects of nonlinear diode junction capacitance on the nose-to-nose calibration

2001 ◽  
Vol 11 (5) ◽  
pp. 196-198 ◽  
Author(s):  
K.A. Remley ◽  
D.F. Williams ◽  
D.C. DeGroot ◽  
J. Verspecht ◽  
J. Kerley
Keyword(s):  
Junction Capacitance

Evaluation of interface junction capacitance of perovskite solar cells by direct current measurement

2019 ◽  
Author(s):  
Satoshi Uchida ◽  
Ludmila Cojocaru ◽  
Hiromi Tobita ◽  
Viraji Jayaweera ◽  
Shoji Kaneko ◽  
...  
Keyword(s):  
Solar Cells ◽  
Direct Current ◽  
Perovskite Solar Cells ◽  
Current Measurement ◽  
Junction Capacitance ◽  
Direct Current Measurement

scholarly journals Improvement of CdS?CuxS Solar Cell Performance by CdS Etching under Illumination

1992 ◽  
Vol 45 (1) ◽  
pp. 99 ◽  
Author(s):  
AM Al-Dhafiri
Keyword(s):  
Solar Cell ◽  
Single Crystals ◽  
Spectral Response ◽  
Cell Performance ◽  
Optical Characteristics ◽  
Solar Cell Performance ◽  
Junction Capacitance ◽  
Capacitance Measurements ◽  
Mixture Phase ◽  
Etched Surface

The influence of dark and light etching of CdS single crystals on the electrical and optical characteristics of the CdS-Cu",S heterojunction is investigated. It is shown through currentvoltage characteristics, spectral response and junction capacitance measurements that the junction of these cells is strongly affected by the presence of light during the etching process. It is found that when the CuS is formed on an etched CdS surface under light a chalcocite phase (CU2S) is obtained. In contrast, when the CuS layer is grown on a dark etched surface a mixture phase of chalcocite and djurleite (CUI� 96S) is found.

STI stress-induced increase in reverse bias junction capacitance

2002 ◽  
Vol 23 (6) ◽  
pp. 312-314 ◽  
Author(s):  
V.P. Gopinath ◽  
H. Puchner ◽  
M. Mirabedini
Keyword(s):  
Reverse Bias ◽  
Junction Capacitance

Vanadium-Related Deep Levels in n-Silicon Detected by Junction Capacitance Waveform Analysis

1992 ◽  
Vol 31 (Part 1, No. 1) ◽  
pp. 87-88 ◽  
Author(s):  
Hisatsugu Kawahara ◽  
Yoichi Okamoto ◽  
Kenichiro Tahira ◽  
Jun Morimoto ◽  
Toru Miyakawa ◽  
...  
Keyword(s):  
Deep Levels ◽  
Waveform Analysis ◽  
Junction Capacitance
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