Accurate de-embedding technique for on-chip small-signal characterization of high-frequency optical modulator

1996 ◽  
Vol 8 (3) ◽  
pp. 402-404 ◽  
Author(s):  
K.K. Loi ◽  
I. Sakamoto ◽  
X.F. Shao ◽  
H.Q. Hou ◽  
H.H. Liao ◽  
...  
2011 ◽  
Vol 20 (03) ◽  
pp. 423-430
Author(s):  
DIEGO GUERRA ◽  
FABIO ALESSIO MARINO ◽  
STEPHEN GOODNICK ◽  
DAVID FERRY ◽  
MARCO SARANITI

A high-frequency a high-power GaN HEMT was analyzed using our full band Cellular Monte Carlo (CMC) simulator, in order to extract small signal parameters and figures of merit, and to correlate them to carrier dynamics and distribution inside the device. A complete RF and DC characterization of the device was performed using experimental data to calibrate the few adjustable parameters of the simulator. Then, gate-related capacitances, such as Cg, Cgd, and Cgs, were directly and indirectly extracted combining small-signal analysis and DC characterization.


2002 ◽  
Vol 37 (6) ◽  
pp. 716-725 ◽  
Author(s):  
B. Kleveland ◽  
Xiaoning Qi ◽  
L. Madden ◽  
T. Furusawa ◽  
R.W. Dutton ◽  
...  
Keyword(s):  

EPE Journal ◽  
2012 ◽  
Vol 22 (1) ◽  
pp. 13-19
Author(s):  
Marco Riva ◽  
Davide Giustina Della ◽  
Federico Belloni

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