Investigation of RuTiN and RuTiO diffusion barrier suggested by a new design concept for future high-density memory capacitors
2003 ◽
Vol 48
(4)
◽
pp. 275-371
◽
2002 ◽
Vol 12
(5)
◽
pp. 373
◽
Keyword(s):
1997 ◽
Vol 80
(10)
◽
pp. 43-48
◽
2004 ◽
Vol 83
(4)
◽
pp. 949-951
◽
2008 ◽
Vol 3
(0)
◽
pp. S1047-S1047
◽
2000 ◽
Vol 31
(1-4)
◽
pp. 351-358
◽