Separation of hot-carrier-induced interface trap creation and oxide charge trapping in PMOSFETs studied by hydrogen/deuterium isotope effect
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2003 ◽
Vol 24
(7)
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pp. 487-489
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2016 ◽
Vol 15
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pp. 163-169
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1992 ◽
Vol 19
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pp. 465-468
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1959 ◽
Vol 81
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pp. 460-466
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1974 ◽
Vol 60
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pp. 127-132
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