A universal MOSFET mobility degradation model for circuit simulation

1990 ◽  
Vol 9 (10) ◽  
pp. 1123-1126 ◽  
Author(s):  
G.M. Heric ◽  
A.F. Tasch ◽  
S.K. Banerjee
Keyword(s):  
Circuit Simulation ◽  
Degradation Model ◽  
Mobility Degradation

A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters

2017 ◽  
Vol 69 ◽  
pp. 1-16 ◽  
Author(s):  
Adelmo Ortiz-Conde ◽  
Andrea Sucre-González ◽  
Fabián Zárate-Rincón ◽  
Reydezel Torres-Torres ◽  
Roberto S. Murphy-Arteaga ◽  
...  
Keyword(s):  
Series Resistance ◽  
Extraction Methods ◽  
Model Parameters ◽  
Degradation Model ◽  
Mobility Degradation

Nonlinear Circuit Simulation and Modeling

2018 ◽  
Author(s):  
José Carlos Pedro ◽  
David E. Root ◽  
Jianjun Xu ◽  
Luís Cótimos Nunes
Keyword(s):  
Circuit Simulation ◽  
Simulation And Modeling ◽  
Nonlinear Circuit
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