Delay-fault test generation and synthesis for testability under a standard scan design methodology

K.-T. Cheng; S. Devadas; K. Keutzer

doi:10.1109/43.238614

Delay-fault test generation and synthesis for testability under a standard scan design methodology

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.238614 ◽

1993 ◽

Vol 12 (8) ◽

pp. 1217-1231 ◽

Cited By ~ 70

Author(s):

K.-T. Cheng ◽

S. Devadas ◽

K. Keutzer

Keyword(s):

Test Generation ◽

Design Methodology ◽

Scan Design ◽

Synthesis For Testability ◽

Delay Fault

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Robust delay-fault test generation and synthesis for testability under a standard scan design methodology

Proceedings of the 28th conference on ACM/IEEE design automation conference - DAC '91 ◽

10.1145/127601.127632 ◽

1991 ◽

Cited By ~ 38

Author(s):

Kwang-Ting Cheng ◽

Srinivas Devadas ◽

Kurt Keutzer

Keyword(s):

Test Generation ◽

Design Methodology ◽

Scan Design ◽

Synthesis For Testability ◽

Delay Fault

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Path-delay fault simulation for a standard scan design methodology

Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computers and Processors ◽

10.1109/iccd.1994.331926 ◽

2002 ◽

Author(s):

Sungho Kang ◽

Wai-On Law ◽

B. Underwood

Keyword(s):

Design Methodology ◽

Fault Simulation ◽

Path Delay ◽

Scan Design ◽

Delay Fault ◽

Path Delay Fault

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A secure Scan Design Methodology

Proceedings of the Design Automation & Test in Europe Conference ◽

10.1109/date.2006.244019 ◽

2006 ◽

Cited By ~ 9

Author(s):

D. Hely ◽

F. Bancel ◽

M.-L. Flottes ◽

B. Rouzeyre

Keyword(s):

Design Methodology ◽

Scan Design

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Automatic path-delay fault test generation for combined resistive vias, resistive bridges, and capacitive crosstalk delay faults

19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) ◽

10.1109/vlsid.2006.51 ◽

2006 ◽

Cited By ~ 2

Author(s):

S. Chary ◽

M.L. Bushnell

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault ◽

Resistive Bridges

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A delay fault model for at-speed fault simulation and test generation

2006 IEEE/ACM International Conference on Computer Aided Design ◽

10.1145/1233501.1233521 ◽

2006 ◽

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Test Generation ◽

Fault Simulation ◽

Fault Model ◽

Delay Fault

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Test Generation for Scan Design Circuits with Tri-State Modules and Bidirectional Terminals

20th Design Automation Conference Proceedings ◽

10.1109/dac.1983.1585628 ◽

1983 ◽

Cited By ~ 18

Author(s):

T. Ogihara ◽

S. Murai ◽

Y. Takamatsu ◽

K. Kinoshita ◽

H. Fujiwara

Keyword(s):

Test Generation ◽

Scan Design

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Sequential test generation and synthesis for testability at the register-transfer and logic levels

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.277606 ◽

1993 ◽

Vol 12 (5) ◽

pp. 579-598 ◽

Cited By ~ 35

Author(s):

A. Ghosh ◽

S. Devadas ◽

A.R. Newton

Keyword(s):

Test Generation ◽

Sequential Test ◽

Synthesis For Testability ◽

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Delay Fault Test Generation with Cellular Aulhomata

The Sixth International Conference on VLSI Design ◽

10.1109/icvd.1993.669697 ◽

2005 ◽

Cited By ~ 3

Author(s):

S. Nandi ◽

B. Vamsi ◽

S. Chakraborty ◽

P.P. Chaudhuri ◽

S. Roy

Keyword(s):

Test Generation ◽

Delay Fault

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On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation

Journal of Electronic Testing ◽

10.1007/s10836-007-5020-8 ◽

2008 ◽

Vol 24 (1-3) ◽

pp. 203-222 ◽

Cited By ~ 3

Author(s):

Kyriakos Christou ◽

Maria K. Michael ◽

Spyros Tragoudas

Keyword(s):

Test Generation ◽

Critical Path ◽

Path Delay ◽

Delay Fault ◽

Critical Path Delay ◽

Path Delay Fault

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Incremental computation of delay fault detection probability for variation-aware test generation

2014 19th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2014.6847805 ◽

2014 ◽

Author(s):

Marcus Wagner ◽

Hans-Joachim Wunderlich

Keyword(s):

Fault Detection ◽

Test Generation ◽

Detection Probability ◽

Delay Fault ◽

Incremental Computation

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