scholarly journals Analysis of lateral-mode behavior in broad-area InGaN quantum-well lasers

2001 ◽  
Vol 37 (2) ◽  
pp. 265-273 ◽  
Author(s):  
W.W. Chow ◽  
H. Amano
2010 ◽  
Vol 50 (5) ◽  
pp. 722-725 ◽  
Author(s):  
Hung-Pin D. Yang ◽  
Chih-Tsung Shih ◽  
Su-Mei Yang ◽  
Tsin-Dong Lee

1990 ◽  
Author(s):  
Gerhard Weiser ◽  
Klaus Satzke ◽  
H. G. Vestner ◽  
L. Goldstein ◽  
A. Perales

Author(s):  
J. Heerlein ◽  
G. Jost ◽  
J. Joos ◽  
S. Morgott ◽  
G. Reiner ◽  
...  

2009 ◽  
Vol 16 (3) ◽  
pp. 375-382 ◽  
Author(s):  
Jun-Rong Chen ◽  
Yung-Chi Wu ◽  
Tien-Chang Lu ◽  
Hao-Chung Kuo ◽  
Yen-Kuang Kuo ◽  
...  

1990 ◽  
Vol 26 (10) ◽  
pp. 1713-1716 ◽  
Author(s):  
C.J. Chang-Hasnain ◽  
E. Kapon ◽  
E. Colas

1989 ◽  
Vol 54 (3) ◽  
pp. 205-207 ◽  
Author(s):  
C. J. Chang‐Hasnain ◽  
E. Kapon ◽  
R. Bhat

2009 ◽  
Vol 1195 ◽  
Author(s):  
Yongkun Sin ◽  
Nathan Presser ◽  
Neil Ives ◽  
Steven C. Moss

AbstractDegradation processes in high power broad-area InGaAs-AlGaAs strained quantum well lasers were studied using electron beam-induced current (EBIC) techniques, time-resolved electroluminescence (TR-EL) techniques, and deep-level transient spectroscopy (DLTS). Accelerated lifetests of the broad-area lasers yielded catastrophic failures at the front facet and also in the bulk. EBIC was employed to study dark line defects generated in degraded lasers stressed under different test conditions. TR-EL was employed to study the intra-cavity intensity distribution in real time as devices were aged. DLTS was employed to study deep electron traps in both pristine and degraded laser diodes. Lastly, we present a possible scenario for the initiation of bulk degradation in the broad-area lasers.


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