Development of an intense pulsed metallic ion beam source

1988 ◽  
Vol 16 (4) ◽  
pp. 459-464 ◽  
Author(s):  
Y. Nakagawa ◽  
T. Ariyoshi
Keyword(s):  
Ion Beam ◽  
Beam Source

An ultra-low energy (30–200 eV) ion-atomic beam source for ion-beam-assisted deposition in ultrahigh vacuum

2011 ◽  
Vol 82 (8) ◽  
pp. 083302 ◽  
Author(s):  
Jindřich Mach ◽  
Tomáš Šamořil ◽  
Stanislav Voborný ◽  
Miroslav Kolíbal ◽  
Jakub Zlámal ◽  
...  
Keyword(s):  
Atomic Beam ◽  
Ion Beam ◽  
Ultrahigh Vacuum ◽  
Low Energy ◽  
Beam Source ◽  
Atomic Beam Source ◽  
Ion Beam Assisted Deposition

A slab‐shaped electron cyclotron resonance ion beam source for in‐line running target treatments

1996 ◽  
Vol 67 (3) ◽  
pp. 1000-1002 ◽  
Author(s):  
V. Roy ◽  
L. Wartski ◽  
F. Boukari ◽  
A. Momy ◽  
C. Schwebel ◽  
...  
Keyword(s):  
Cyclotron Resonance ◽  
Electron Cyclotron Resonance ◽  
Ion Beam ◽  
Electron Cyclotron ◽  
Beam Source

Metal cluster complex primary ion beam source for secondary ion mass spectrometry (SIMS)

Vacuum ◽  
2009 ◽  
Vol 84 (5) ◽  
pp. 544-549 ◽  
Author(s):  
Yukio Fujiwara ◽  
Kouji Watanabe ◽  
Hidehiko Nonaka ◽  
Naoaki Saito ◽  
Atsushi Suzuki ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Metal Cluster ◽  
Ion Beam ◽  
Cluster Complex ◽  
Beam Source ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals ECR as a ion beam source.

1990 ◽  
Vol 41 (9) ◽  
pp. 882-887
Author(s):  
Ken-ichi TAKAGI
Keyword(s):  
Ion Beam ◽  
Beam Source

Determination of Ion Beam Properties In Nitrogen and Helium Using Mather Type Plasma Focus Device

2014 ◽  
Vol 71 (5) ◽  
Author(s):  
Someraa Saleh Shakonah ◽  
Jalil Ali ◽  
Natashah Abd. Rashid ◽  
Kashif Chaudhary
Keyword(s):  
Plasma Focus ◽  
Beam Energy ◽  
Ion Beam ◽  
Beam Current ◽  
Plasma Focus Device ◽  
Lee Model Code ◽  
Beam Source ◽  
Model Code ◽  
Pressure Regime

Some of ion beam properties have been investigated by using Lee model code on plasma focus devices which is operated with nitrogen and helium gases. The operation of plasma focus in different pressure regime gives a consistent ion beam properties which can make the plasma focus a reliable ion beam source .These ion beam properties such as ion beam flux, ion beam fluence, ion beam energy, ion beam current, and beam ion number corresponding to gas pressure have been studied for Mather type plasma focus device. The result shows the differences between helium as lighter gas and nitrogen as heavier gas in term of ion beam properties. The fluence and flux are decrease for nitrogen while increase for helium. 

Compact Metal-Ion Beam Source Using Thermal Contact Ionizer

1983 ◽  
Vol 22 (Part 1, No. 6) ◽  
pp. 1048-1056 ◽  
Author(s):  
Yoshiyuki Sakai ◽  
Itsuo Katsumata ◽  
Takanori Oshio
Keyword(s):  
Metal Ion ◽  
Ion Beam ◽  
Thermal Contact ◽  
Beam Source

Calculations involving ion beam source

1978 ◽  
Vol 28 (3) ◽  
pp. 408-415 ◽  
Author(s):  
J.C. Whitson ◽  
J. Smith ◽  
J.H. Whealton
Keyword(s):  
Ion Beam ◽  
Beam Source
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