Correlation of proton and heavy-ion test results on CMOS bulk memories used for space applications

1992 ◽  
Vol 39 (3) ◽  
pp. 450-454 ◽  
Author(s):  
E.G. Stassinopoulos ◽  
J. Borowick
Keyword(s):  
Heavy Ion ◽  
Test Results ◽  
Space Applications

A Commercial 65 nm CMOS Technology for Space Applications: Heavy Ion, Proton and Gamma Test Results and Modeling

2010 ◽  
Vol 57 (4) ◽  
pp. 2079-2088 ◽  
Author(s):  
Philippe Roche ◽  
Gilles Gasiot ◽  
Slawosz Uznanski ◽  
Jean-Marc Daveau ◽  
Josep Torras-Flaquer ◽  
...  
Keyword(s):  
Cmos Technology ◽  
Heavy Ion ◽  
Test Results ◽  
Gamma Test ◽  
Space Applications ◽  
Ion Proton

Heavy-Ion SEE Test Results for Amplifiers

2018 ◽  
Author(s):  
A. Kalashnikova ◽  
V. Anashin ◽  
P. Chubunov ◽  
A. Koziukov ◽  
S. Iakovlev ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Test Results

scholarly journals An Experimental Characterization of TORVEastro, Cable-Driven Astronaut Robot

Robotics ◽  
2021 ◽  
Vol 10 (1) ◽  
pp. 21
Author(s):  
Francesco Samani ◽  
Marco Ceccarelli
Keyword(s):  
Mechanical Design ◽  
Vision System ◽  
Service Robot ◽  
Test Results ◽  
Operation Performance ◽  
Space Applications ◽  
Outdoor Space ◽  
Motion Characteristics ◽  
Three Degree Of Freedom

TORVEastro robot design is presented with a built prototype in LARM2 (Laboratory of Robot Mechatronics) for testing and characterizing its functionality for service in space stations. Several robot astronauts are designed with bulky human-like structures that cannot be convenient for outdoor space service in monitoring and maintenance of the external structures of orbital stations. The design features of TORVEastro robot are discussed with its peculiar mechanical design with 3 arm-legs as agile service robot astronaut. A lab prototype is used to test the operation performance and the feasibility of its peculiar design. The robot weighs 1 kg, and consists of a central torso, three identical three-degree of freedom (DoF) arm–legs and one vision system. Test results are reported to discuss the operation efficiency in terms of motion characteristics and power consumption during lab experiments that nevertheless show the feasibility of the robot for outdoor space applications.

Reliability of Low Glass Transition Temperature COTS PEM’s for Space Applications

2003 ◽  
Author(s):  
M. Sandor ◽  
S. Agarwal ◽  
D. Peters ◽  
M. S. Cooper
Keyword(s):  
Glass Transition ◽  
Transition Temperature ◽  
Glass Transition Temperature ◽  
Flame Retardants ◽  
Measurement Techniques ◽  
Test Results ◽  
Space Applications ◽  
Molding Compound ◽  
Different Temperatures ◽  
Compound Materials

Microcircuit manufacturers of Plastic Encapsulated Microcircuits (PEM’s) have made changes in epoxy molding compound materials and chemistry, which lower Glass Transition Temperature (Tg). PEM users in harsh environments have concerns if either the part in its application, or in evaluation or assembly, is used close to, or above, the Tg. Various Tg measurement techniques are available and discussed. Test results from one technique is reviewed. The implications of the Tg results on usage of these parts in space applications will be presented. Burn-in/ reliability test results of samples with low Tg PEM’s will be presented. The reliability experiments include testing under different temperatures. The issue being addressed is whether outgassing of molding compounds occurs when the temperature of the molding compound exceeds the Tg. This is a caution noted by many vendors. As an example outgassing of flame retardants can degrade parametric performance and wire bond integrity. This would be the case when PEMS are being qualified for Space applications using burn-in or in storage environments. JPL’s past experience has shown that COTS PEMS parametrics can degrade significantly even when the burn-in temperature is well below the Tg. Two different microcircuits exhibiting low Tg were evaluated. Assessment of final electrical test measurements and yield are shown.

Correlation of Laser Test Results With Heavy Ion Results for NAND Flash Memory

2012 ◽  
Vol 59 (6) ◽  
pp. 2831-2836 ◽  
Author(s):  
T. R. Oldham ◽  
M. R. Friendlich ◽  
E. P. Wilcox ◽  
K. A. LaBel ◽  
S. P. Buchner ◽  
...  
Keyword(s):  
Flash Memory ◽  
Heavy Ion ◽  
Nand Flash ◽  
Test Results ◽  
Nand Flash Memory

Heavy ion test results on memories

2003 ◽  
Author(s):  
R. Ecoffet ◽  
M. Labrunee ◽  
S. Duzellier ◽  
D. Falguere
Keyword(s):  
Heavy Ion ◽  
Test Results
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