Workshop Record 1992 IEEE Radiation Effects Data Workshop
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Published By IEEE

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Heavy ion testing using the GANIL accelerator and compilation of results with predictions

Workshop Record 1992 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.1992.247329 ◽

2003 ◽

Cited By ~ 9

Author(s):

C. Dufour ◽

P. Garnier ◽

J. Beaucour ◽

H. Delagrange

Keyword(s):

Heavy Ion

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Heavy ion test results on memories

Workshop Record 1992 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.1992.247328 ◽

2003 ◽

Cited By ~ 33

Author(s):

R. Ecoffet ◽

M. Labrunee ◽

S. Duzellier ◽

D. Falguere

Keyword(s):

Heavy Ion ◽

Test Results

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Radiation design test data for advanced CMOS product

Workshop Record 1992 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.1992.247323 ◽

2003 ◽

Cited By ~ 2

Author(s):

M.C. Maher

Keyword(s):

Test Data

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QML qualified 256 K radiation-hardened CMOS SRAM

Workshop Record 1992 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.1992.247321 ◽

2003 ◽

Cited By ~ 4

Author(s):

R. Brown ◽

J. Damato ◽

N. Haddad ◽

B. Posey ◽

T. Scott ◽

...

Keyword(s):

Radiation Hardened

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Low dose rate radiation testing of advanced CMOS technology (AC/ACT) series parts for space flight applications

Workshop Record 1992 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.1992.247324 ◽

2003 ◽

Cited By ~ 4

Author(s):

A.K. Sharma ◽

K. Sahu

Keyword(s):

Dose Rate ◽

Space Flight ◽

Low Dose ◽

Cmos Technology ◽

Low Dose Rate ◽

Radiation Testing

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SEU testing of 32-bit microprocessors (for space application)

Workshop Record 1992 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.1992.247330 ◽

2003 ◽

Cited By ~ 11

Author(s):

R. Velazco ◽

S. Karoui ◽

T. Chapuis

Keyword(s):

Space Application

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Radiation pre-screening of R3000/R3000A microprocessors

Workshop Record 1992 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.1992.247327 ◽

2003 ◽

Cited By ~ 6

Author(s):

R. Harboe-Sorensen ◽

A.T. Sund

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Ionizing radiation effects on commercial 256 K EEPROM's

Workshop Record 1992 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.1992.247326 ◽

2003 ◽

Cited By ~ 2

Author(s):

M.E. Bumbaugh ◽

D.S. Rosario

Keyword(s):

Ionizing Radiation ◽

Radiation Effects

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1 mu m CMOS gate array radiation hardened technology

Workshop Record 1992 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.1992.247322 ◽

2003 ◽

Author(s):

A.H. Owens ◽

A. Yee ◽

S. Toutounchi ◽

M. Lyu ◽

W.C. Schneider ◽

...

Keyword(s):

Radiation Hardened ◽

Gate Array

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A summary of recent VLSI SEU and latch-up testing (for space application)

Workshop Record 1992 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.1992.247331 ◽

2003 ◽

Cited By ~ 2

Author(s):

J.D. Kinnison ◽

R.H. Maurer ◽

P.L. McKerracher ◽

B.G. Carkhuff

Keyword(s):

Space Application ◽

Latch Up

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Workshop Record 1992 IEEE Radiation Effects Data WorkshopLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Heavy ion testing using the GANIL accelerator and compilation of results with predictions

Heavy ion test results on memories

Radiation design test data for advanced CMOS product

QML qualified 256 K radiation-hardened CMOS SRAM

Low dose rate radiation testing of advanced CMOS technology (AC/ACT) series parts for space flight applications

SEU testing of 32-bit microprocessors (for space application)

Radiation pre-screening of R3000/R3000A microprocessors

Ionizing radiation effects on commercial 256 K EEPROM's

1 mu m CMOS gate array radiation hardened technology

A summary of recent VLSI SEU and latch-up testing (for space application)

Workshop Record 1992 IEEE Radiation Effects Data Workshop
Latest Publications