Characterization of buried microstrip lines for constructing high-density microwave integrated circuits

1996 ◽  
Vol 44 (6) ◽  
pp. 840-847 ◽  
Author(s):  
T. Ishikawa ◽  
E. Yamashita
Keyword(s):  
Integrated Circuits ◽  
High Density ◽  
Microwave Integrated Circuits ◽  
Microstrip Lines

Design and characterization of an integrated microwave generator for BIST applications

2014 ◽  
Vol 6 (2) ◽  
pp. 195-200 ◽  
Author(s):  
Imene Lahbib ◽  
Mohamed Aziz Doukkali ◽  
Philippe Descamps ◽  
Patrice Gamand ◽  
Christophe Kelma ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Low Cost ◽  
Signal Generator ◽  
Test Method ◽  
Microwave Integrated Circuits ◽  
Cost Measurement ◽  
Bicmos Process ◽  
On Chip ◽  
Rf Signal

This paper presents a circuit architecture for a new integrated on chip test method for microwave circuits. The proposed built-in-self-test (BIST) cell targets a direct low-cost measurement technique of the gain and the 1 dB input compression point (CP1) of a K-band satellite receiver in the 18–22 GHz frequency bandwidth. A signal generator at the radiofrequency (RF) front end input of the device under test (DUT) has been integrated on the same chip. To inject this RF signal, a loopback technique has been used and the design has been accommodated for it. This paper focuses on the design of the most sensitive block of the BIST circuit, i.e. the RF signal generator. This circuit, fabricated in a SIGe:C BiCMOS process, consumes 10 mA. It presents a dynamic power range of 17 dB (−41; −24 dBm) and operates in a frequency range of 5.6 GHz (17.5; 23 GHz). This BIST circuit gives new perspectives in terms of test strategy, cost reduction, and measurement accuracy for microwave-integrated circuits and could be adapted for mm-wave circuits.

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