Characterization of change of carbon bonding due to sliding wear damage by scanning Auger microscopy

1993 ◽  
Vol 29 (6) ◽  
pp. 3939-3941 ◽  
Author(s):  
T.-A. Yeh ◽  
C.-L. Lin ◽  
J.M. Sivertsen ◽  
J.H. Judy ◽  
G.-L. Chen
Keyword(s):  
Sliding Wear ◽  
Scanning Auger Microscopy ◽  
Wear Damage ◽  
Auger Microscopy ◽  
Carbon Bonding

Characterization of CVD-layers by scanning Auger microscopy

1986 ◽  
Vol 9 (5) ◽  
pp. 341-341
Author(s):  
A. Riahi ◽  
M. Puchhammer ◽  
H. Störi ◽  
C. Colombier ◽  
B. Lux
Keyword(s):  
Scanning Auger Microscopy ◽  
Auger Microscopy

Scanning Auger Microscopy Characterization of Magnetic Hard Disc

1997 ◽  
Vol 475 ◽  
Author(s):  
D. W. Harris ◽  
D. L. Neiman ◽  
J. Huang
Keyword(s):  
Thin Layer ◽  
Field Emission ◽  
Small Particle ◽  
Layer Structure ◽  
Structure Characterization ◽  
Atomic Percent ◽  
Scanning Auger Microscopy ◽  
Auger Microscopy ◽  
Microscopy Characterization

ABSTRACTApplications of Zalar rotation and field emission Auger (FE-AES) analysis in various magnetic hard disc problems will be presented. These applications include thin layer structure characterization, low concentration contaminant (0.1–0.5 atomic percent) detection at deeper interfaces (greater than 1000Å), and small particle (-∼1000Å) contaminant identification.

scholarly journals Characterization of Sic Fibers by Soft X-Ray Photoelectron and Photoabsorption Spectroscopies and Scanning Auger Microscopy

1996 ◽  
Vol 437 ◽  
Author(s):  
Qing Ma ◽  
M. W. Mcdowell ◽  
R. A. Rosenberg
Keyword(s):  
Depth Profiling ◽  
Chemical Vapor ◽  
Layer Depth ◽  
X Ray ◽  
Sic Fibers ◽  
Line Shapes ◽  
Scanning Auger Microscopy ◽  
Auger Microscopy ◽  
Sic Coatings

AbstractSynchrotron radiation soft x-ray photoelectron and photoabsorption spectroscopy was used to characterize commercially obtained SiC fibers, which were produced by chemical vapor deposition (CVD) of SiC on a W core, followed by a carbon passivating layer. Depth profiling of the fiber through the carbon/SiC interface was done by making Si 2p and C ls core level PES and PAS, as well as scanning Auger microscopy, measurements following Ar+ sputtering. No significant changes in either photoemission or absorption or Auger line shapes were observed as a function of the depth, which indicates that there is no significant interfacial reaction. The line shapes of the carbonaceous coatings are predominately graphite-like and those of the CVD SiC coatings are microcrystalline, with presence of disorder to some extent in both cases.

New insights into the characterization of the electrode/electrolyte interfaces within LiMn2O4/Li4Ti5O12 cells, by X-ray photoelectron spectroscopy, scanning Auger microscopy and time-of-flight secondary ion mass spectrometry

2017 ◽  
Vol 5 (29) ◽  
pp. 15315-15325 ◽  
Author(s):  
Jean-Baptiste Gieu ◽  
Volker Winkler ◽  
Cécile Courrèges ◽  
Loubna El Ouatani ◽  
Cécile Tessier ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
X Ray ◽  
Scanning Auger Microscopy ◽  
Ion Mass Spectrometry ◽  
Auger Microscopy ◽  
Secondary Ion

This work aims to study the electrode/electrolyte interfaces in a Li4Ti5O12 (LTO)/LiMn2O4 (LMO) cell assembled with a VC-containing electrolyte and operating at 60 °C.

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