LOCOS-induced stress effects on thin-film SOI devices

1997 ◽  
Vol 44 (4) ◽  
pp. 646-650 ◽  
Author(s):  
Cheng-Liang Huang ◽  
H.R. Soleimani ◽  
G.J. Grula ◽  
J.W. Sleight ◽  
A. Villani ◽  
...  
Keyword(s):  
Thin Film ◽  
Stress Effects ◽  
Induced Stress ◽  
Soi Devices

Origin of threshold voltage shift by interfacial trap density in amorphous InGaZnO thin film transistor under temperature induced stress

2011 ◽  
Vol 99 (6) ◽  
pp. 062108 ◽  
Author(s):  
Bosul Kim ◽  
Eugene Chong ◽  
Do Hyung Kim ◽  
Yong Woo Jeon ◽  
Dae Hwan Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Threshold Voltage ◽  
Thin Film Transistor ◽  
Trap Density ◽  
Threshold Voltage Shift ◽  
Voltage Shift ◽  
Induced Stress ◽  
Amorphous Ingazno

Negative gate bias stress effects on conduction and low frequency noise characteristics in p-type poly-Si thin-film transistors

2019 ◽  
Vol 28 (8) ◽  
pp. 088502
Author(s):  
Chao-Yang Han ◽  
Yuan Liu ◽  
Yu-Rong Liu ◽  
Ya-Yi Chen ◽  
Li Wang ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Gate Bias ◽  
Stress Effects ◽  
Bias Stress ◽  
Noise Characteristics ◽  
P Type ◽  
Si Thin Film

scholarly journals Numerical modeling of linear doping profiles for high-voltage thin-film SOI devices

1999 ◽  
Vol 46 (5) ◽  
pp. 1036-1041 ◽  
Author(s):  
Shengdong Zhang ◽  
J.K.O. Sin ◽  
T.M.L. Lai ◽  
P.K. Ko
Keyword(s):  
Thin Film ◽  
Numerical Modeling ◽  
High Voltage ◽  
Soi Devices ◽  
Doping Profiles

Transient behaviors in partially depleted thin film SOI devices

2002 ◽  
Author(s):  
H.C. Shin ◽  
I.S. Lim ◽  
M. Racanelli ◽  
W.M. Huang ◽  
J. Foerstner ◽  
...  
Keyword(s):  
Thin Film ◽  
Soi Devices

Photo-Related Stress Effects in a-SiGe:H Thin Film Transistors for Infrared Image Sensors

2013 ◽  
Vol 9 (1) ◽  
pp. 30-36 ◽  
Author(s):  
Sang Youn Han ◽  
Kyung Sook Jeon ◽  
Junho Song ◽  
Ho Sik Jeon ◽  
Byung Seong Bae
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Infrared Image ◽  
Image Sensors ◽  
Stress Effects ◽  
Related Stress ◽  
Infrared Image Sensors

Analysis of floating body induced transient behaviors in partially depleted thin film SOI devices

1996 ◽  
Vol 43 (2) ◽  
pp. 318-325 ◽  
Author(s):  
H.C. Shin ◽  
Ik-Sung Lim ◽  
M. Racanelli ◽  
Wen-Ling Margaret Huang ◽  
J. Foerstner ◽  
...  
Keyword(s):  
Thin Film ◽  
Floating Body ◽  
Soi Devices
Sign in / Sign up

Export Citation Format

Share Document