Modeling of minority-carrier transport in semiconductor regions with position-dependent material parameters at arbitrary injection levels

1996 ◽  
Vol 43 (8) ◽  
pp. 1256-1263 ◽  
Author(s):  
N.F. Rinaldi
1995 ◽  
Vol 67 (1) ◽  
pp. 88-90 ◽  
Author(s):  
D. C. Leung ◽  
P. R. Nelson ◽  
O. M. Stafsudd ◽  
J. B. Parkinson ◽  
G. E. Davis

2006 ◽  
Vol 36 (2a) ◽  
pp. 343-346 ◽  
Author(s):  
I. Camps ◽  
A. Vercik ◽  
L. F. dos Santos ◽  
Y. Galvão Gobato

2011 ◽  
Vol 109 (1) ◽  
pp. 016107 ◽  
Author(s):  
Y. Lin ◽  
M. Shatkhin ◽  
E. Flitsiyan ◽  
L. Chernyak ◽  
Z. Dashevsky ◽  
...  

1985 ◽  
Vol 32 (4) ◽  
pp. 807-816 ◽  
Author(s):  
A. Neugroschel ◽  
M. Arienzo ◽  
Y. Komem ◽  
R.D. Isaac

1993 ◽  
Vol 47 (23) ◽  
pp. 15601-15608 ◽  
Author(s):  
D. J. Wolford ◽  
G. D. Gilliland ◽  
T. F. Kuech ◽  
J. A. Bradley ◽  
H. P. Hjalmarson

1986 ◽  
Vol 90 ◽  
Author(s):  
S. R. Jost ◽  
V. F. Meikleham ◽  
T. H. Myers

ABSTRACTInSb has served as an important mid-wave IR (λ=3−5μm) detector material for several decades. In this presentation, we will briefly review General Electric's InSb Charge Injection Device technology. Emphasis will be placed on device performance as a function of material parameters. A new InSb materials technology utilizing liquid phase epitaxy will be described. This epitaxial growth technology improves InSb material parameters and increases minority carrier lifetimes by more than two orders of magnitude to near the Auger limit. Comparisons will be made between available bulk material parameters and that of the epitaxial material.


Carbon ◽  
1999 ◽  
Vol 37 (5) ◽  
pp. 811-816 ◽  
Author(s):  
S. Salvatori ◽  
M. C. Rossi ◽  
F. Galluzzi

Sign in / Sign up

Export Citation Format

Share Document