Temperature-dependent hole and electron mobility models for CMOS circuit simulation

1995 ◽  
Vol 42 (11) ◽  
pp. 1956-1961 ◽  
Author(s):  
Kyeong-Sik Min ◽  
Kwyro Lee
Keyword(s):  
Electron Mobility ◽  
Circuit Simulation ◽  
Mobility Models ◽  
Cmos Circuit ◽  
Temperature Dependent

Noise modeling for RF CMOS circuit simulation

2003 ◽  
Vol 50 (3) ◽  
pp. 618-632 ◽  
Author(s):  
A.J. Scholten ◽  
L.F. Tiemeijer ◽  
R. van Langevelde ◽  
R.J. Havens ◽  
A.T.A. Zegers-van Duijnhoven ◽  
...  
Keyword(s):  
Circuit Simulation ◽  
Rf Cmos ◽  
Cmos Circuit ◽  
Noise Modeling

Efficacy of Electron Mobility Models in Hybrid-PIC Hall Thruster Simulations

2008 ◽  
Author(s):  
Richard Hofer ◽  
Ira Katz ◽  
Dan Goebel ◽  
Kristina Jameson ◽  
Regina Sullivan ◽  
...  
Keyword(s):  
Electron Mobility ◽  
Hall Thruster ◽  
Mobility Models
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