Interpretation of transient currents in amorphous-silicon hydride p-i-n and n-i-n devices

1989 ◽  
Vol 36 (12) ◽  
pp. 2785-2788 ◽  
Author(s):  
F.R. Shapiro ◽  
Y. Bar-Yam ◽  
M. Silver
1989 ◽  
Vol 149 ◽  
Author(s):  
Finley R. Shapiro ◽  
Marvin Silver

ABSTRACTExperimentally measured current-voltage measurements in amorphous silicon hydride pin diodes have been fit to computer simulations by Hack and den Boer [1] using relatively small values for the neutral and charged trap capture rates. Silver and Cannella [2] have proposed larger values for the capture rates, accompanied by larger electron and hole band mobilities. We discuss here the possible reasons for expecting the larger values for the capture rates, and their influence on current voltage measurements both with and without the higher mobilities. It is found that the simulated I-V results using only the larger capture rates are much smaller than those for Hack and den Boer's parameters. However, when the large values are used for both the capture rates and the mobilities, the I-V relationship is quite similar to that for the smaller capture rates and mobilities. We also show the differences in the simulated transient currents for the different sets of parameters, and we discuss the causes of these differences.


2003 ◽  
Vol 547 (3) ◽  
pp. L865-L870 ◽  
Author(s):  
W.M.M. Kessels ◽  
J.P.M. Hoefnagels ◽  
P.J. van den Oever ◽  
Y. Barrell ◽  
M.C.M. van de Sanden

1991 ◽  
Vol 219 ◽  
Author(s):  
Finley R. Shapiro

ABSTRACTThe simulation of a-Si:H solar cells has the potential to make a major contribution to the development of improved devices. However, to achieve this potential, simulations must run quickly on personal computers. This will require simplified approaches which are justified by the correspondence of their results to more elaborate but slower running simulations.


1997 ◽  
Vol 101 (46) ◽  
pp. 9537-9547 ◽  
Author(s):  
C.-M. Chiang ◽  
S. M. Gates ◽  
Szetsen S. Lee ◽  
M. Kong ◽  
Stacey F. Bent

1990 ◽  
Vol 192 ◽  
Author(s):  
George D. Cody

ABSTRACTOptical phenomena associated with the absorption edge of crystalline silicon (c-Si) and amorphous silicon hydride (a-Si:H) are presented and compared. The optical properties discussed include the energy dependence, dipole matrix element and density of states associated with the absorption edge; the temperature dependence of the relevant optical energy gaps, and finally the magnitude and temperature dependence of the slope of the Urbach edge for each material. The comparison suggests that the optical properties of the two materials are closely related and that the absorption edge of a-Si:H may be derived from the effect of site disorder on the zone center direct gap of c-Si.


2003 ◽  
Vol 80 (1) ◽  
pp. 1-20 ◽  
Author(s):  
Randell L Mills ◽  
Bala Dhandapani ◽  
Jiliang He

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