Thermal simulation of thin-film interconnect failure caused by high current pulses
1995 ◽
Vol 42
(7)
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pp. 1386-1388
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Keyword(s):
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1999 ◽
Vol 30
(11)
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pp. 1155-1162
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1966 ◽
Vol PAS-85
(11)
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pp. 1177-1188
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2005 ◽
Vol 45
(2)
◽
pp. 391-395
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1994 ◽
Vol 41
(8)
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pp. 1429-1434
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2017 ◽
Vol 31
(18)
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pp. 2064-2073
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