Nanometer-Scale Creation and Characterization of Trapped Charge in SiO2Films Using Ballistic Electron Emission Microscopy

1996 ◽  
Vol 77 (1) ◽  
pp. 91-94 ◽  
Author(s):  
B. Kaczer ◽  
Z. Meng ◽  
J. P. Pelz
Keyword(s):  
Electron Emission ◽  
Nanometer Scale ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy ◽  
Scale Creation ◽  
Trapped Charge

Nanometer-scale investigation of metal-SiC interfaces using ballistic electron emission microscopy

1998 ◽  
Vol 27 (4) ◽  
pp. 345-352 ◽  
Author(s):  
H. J. Im ◽  
B. Kaczer ◽  
J. P. Pelz ◽  
S. Limpijumnong ◽  
W. R. L. Lambrecht ◽  
...  
Keyword(s):  
Electron Emission ◽  
Nanometer Scale ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Erasable nanometer-scale modification at the Au/Si interface by ballistic electron emission microscopy

1999 ◽  
Vol 75 (23) ◽  
pp. 3668-3670 ◽  
Author(s):  
Y. Hasegawa ◽  
K. Akiyama ◽  
M. Ono ◽  
S.-J. Kahng ◽  
Q. K. Xue ◽  
...  
Keyword(s):  
Electron Emission ◽  
Nanometer Scale ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy
Sign in / Sign up

Export Citation Format

Share Document