Characterization of nanopipes/dislocations in silicon carbide using ballistic electron emission microscopy

2001 ◽  
Vol 89 (10) ◽  
pp. 5797-5799 ◽  
Author(s):  
C. V. Reddy ◽  
V. Narayanamurti
Keyword(s):  
Silicon Carbide ◽  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Nanoscale characterization of oxidized ultrathin Co-films by ballistic electron emission microscopy

2016 ◽  
Vol 3 (1) ◽  
pp. 015001
Author(s):  
Kuan Eng Johnson Goh ◽  
Simin Wang ◽  
Siew Ting Melissa Tan ◽  
Zheng Zhang ◽  
Hiroyo Kawai ◽  
...  
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Nanoscale Characterization ◽  
Emission Microscopy

Schottky barrier formation at metal/n-ZnSe interfaces and characterization of Au/n-ZnSe by ballistic electron emission microscopy

1997 ◽  
Vol 81 (12) ◽  
pp. 7870-7875 ◽  
Author(s):  
R. Coratger ◽  
C. Girardin ◽  
J. Beauvillain ◽  
I. M. Dharmadasa ◽  
A. P. Samanthilake ◽  
...  
Keyword(s):  
Schottky Barrier ◽  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Barrier Formation ◽  
Emission Microscopy
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