Erasable nanometer-scale modification at the Au/Si interface by ballistic electron emission microscopy

1999 ◽  
Vol 75 (23) ◽  
pp. 3668-3670 ◽  
Author(s):  
Y. Hasegawa ◽  
K. Akiyama ◽  
M. Ono ◽  
S.-J. Kahng ◽  
Q. K. Xue ◽  
...  
Keyword(s):  
Electron Emission ◽  
Nanometer Scale ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Nanometer-scale investigation of metal-SiC interfaces using ballistic electron emission microscopy

1998 ◽  
Vol 27 (4) ◽  
pp. 345-352 ◽  
Author(s):  
H. J. Im ◽  
B. Kaczer ◽  
J. P. Pelz ◽  
S. Limpijumnong ◽  
W. R. L. Lambrecht ◽  
...  
Keyword(s):  
Electron Emission ◽  
Nanometer Scale ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

scholarly journals Theory of ballistic electron emission microscopy

2001 ◽  
Vol 66 (1-2) ◽  
pp. 3-51 ◽  
Author(s):  
P.L. de Andres ◽  
F.J. Garcia-Vidal ◽  
K. Reuter ◽  
F. Flores
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Observation of misfit dislocations at the InxGa1−xAs/GaAs interface by ballistic‐electron‐emission microscopy

1996 ◽  
Vol 69 (7) ◽  
pp. 940-942 ◽  
Author(s):  
E. Y. Lee ◽  
S. Bhargava ◽  
M. A. Chin ◽  
V. Narayanamurti ◽  
K. J. Pond ◽  
...  
Keyword(s):  
Electron Emission ◽  
Misfit Dislocations ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Au/n-ZnSe contacts studied with use of ballistic-electron-emission microscopy

1995 ◽  
Vol 51 (4) ◽  
pp. 2357-2362 ◽  
Author(s):  
R. Coratger ◽  
F. Ajustron ◽  
J. Beauvillain ◽  
I. M. Dharmadasa ◽  
C. J. Blomfield ◽  
...  
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy
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