Kinetic model for a step edge in epitaxial growth

1999 ◽  
Vol 59 (6) ◽  
pp. 6879-6887 ◽  
Author(s):  
Russel E. Caflisch ◽  
Weinan E ◽  
Mark F. Gyure ◽  
Barry Merriman ◽  
Christian Ratsch
2008 ◽  
Vol 7 (1) ◽  
pp. 242-273 ◽  
Author(s):  
Dionisios Margetis ◽  
Russel E. Caflisch

2008 ◽  
Vol 600-603 ◽  
pp. 135-138 ◽  
Author(s):  
Massimo Camarda ◽  
Antonino La Magna ◽  
Patrick Fiorenza ◽  
Gaetano Izzo ◽  
Francesco La Via

A novel Monte Carlo kinetic model has been developed and implemented to predict growth rate regimes and defect formation for the homo-epitaxial growth of various SiC polytypes on different substrates. Using this model we have studied the generation of both point like and extended defects in terms of the growth rate and off-cut angle, finding qualitative agreement with both electrical and optical characterization and analytical results.


2011 ◽  
Vol 158 (4) ◽  
pp. H457 ◽  
Author(s):  
M. Kolahdouz ◽  
L. Maresca ◽  
R. Ghandi ◽  
A. Khatibi ◽  
H. H. Radamson

1999 ◽  
Vol 570 ◽  
Author(s):  
Tsu-Yi Fu ◽  
Tien T. Tsong

ABSTRACTSolid surfaces have many lattice steps. In epitaxy, aggregation of deposited atoms into islands or clusters during their diffusing can create many additional atomic steps. We study the effects of lattice steps on epitaxial growth in two aspects: 1. Movement of atoms across the step edge: a series of field ion microscope experiments reveal the importance of reflective and trapping properties of steps, and provide quantitative information that helps explain various growth modes observed in homoepitaxial growth. 2. Diffusion along the step edge: a number of field ion microscope experiments are done to determine diffusion parameters of a ledge atom along the step edge, and to derive the potential-energy diagram along different diffusion paths that helps explain the growth morphology. During growth, an atom undergoes a number of elementary atomic processes. Each process is characterized by a few energy parameters in bonding and diffusion. The integrated effect of all of these processes determines the growth process. We provide reliable experimental data and find the temperature ranges where various atomic processes are important


1999 ◽  
Vol 121-122 ◽  
pp. 347-352 ◽  
Author(s):  
M. Biehl ◽  
M. Kinne ◽  
W. Kinzel ◽  
S. Schinzer

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