Coulomb and strong interactions in the final state of Hanbury-Brown–Twiss correlations for Lévy-type source functions

D. Kincses; M. I. Nagy; M. Csanád

doi:10.1103/physrevc.102.064912

Washing-out final-state strong interactions in the longitudinal polarization asymmetry for e+e−→hadron near the Z0 peak to lowest e.m. order

Il Nuovo Cimento A ◽

10.1007/bf02894802 ◽

1986 ◽

Vol 94 (1) ◽

pp. 15-24 ◽

Cited By ~ 4

Author(s):

B. W. Lynn ◽

C. Verzegnassi

Keyword(s):

Strong Interactions ◽

Longitudinal Polarization ◽

Polarization Asymmetry ◽

Final State

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200kv superconducting cryo electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100127645 ◽

1987 ◽

Vol 45 ◽

pp. 642-643

Author(s):

M. Iwatsuki ◽

Y. Kokubo ◽

Y. Harada ◽

J. Lehman

Keyword(s):

Electron Microscope ◽

Structure Analysis ◽

Organic Materials ◽

Strong Interactions ◽

Specimen Preparation ◽

Great Effort ◽

Electron Microscopic ◽

Crystal Fields ◽

Special Skill ◽

Long Time

In recent years, the electron microscope has been significantly improved in resolution and we can obtain routinely atomic-level high resolution images without any special skill. With this improvement, the structure analysis of organic materials has become one of the interesting targets in the biological and polymer crystal fields.Up to now, X-ray structure analysis has been mainly used for such materials. With this method, however, great effort and a long time are required for specimen preparation because of the need for larger crystals. This method can analyze average crystal structure but is insufficient for interpreting it on the atomic or molecular level. The electron microscopic method for organic materials has not only the advantage of specimen preparation but also the capability of providing various information from extremely small specimen regions, using strong interactions between electrons and the substance. On the other hand, however, this strong interaction has a big disadvantage in high radiation damage.

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New form of Transmission Cross Coefficient for High-Resolution Imaging

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100179051 ◽

1990 ◽

Vol 48 (1) ◽

pp. 60-61

Author(s):

Kazuo Ishizuka

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Function ◽

Incident Beam ◽

Optical Microscope ◽

Strong Interactions ◽

Small Range ◽

Specimen Thickness ◽

Beam Direction ◽

Diffracted Waves

It is well known that taking into account spacial and temporal coherency of illumination as well as the wave aberration is important to interpret an image of a high-resolution electron microscope (HREM). This occues, because coherency of incident electrons restricts transmission of image information. Due to its large spherical and chromatic aberrations, the electron microscope requires higher coherency than the optical microscope. On an application of HREM for a strong scattering object, we have to estimate the contribution of the interference between the diffracted waves on an image formation. The contribution of each pair of diffracted waves may be properly represented by the transmission cross coefficients (TCC) between these waves. In this report, we will show an improved form of the TCC including second order derivatives, and compare it with the first order TCC.In the electron microscope the specimen is illuminated by quasi monochromatic electrons having a small range of illumination directions. Thus, the image intensity for each energy and each incident direction should be summed to give an intensity to be observed. However, this is a time consuming process, if the ranges of incident energy and/or illumination direction are large. To avoid this difficulty, we can use the TCC by assuming that a transmission function of the specimen does not depend on the incident beam direction. This is not always true, because dynamical scattering is important owing to strong interactions of electrons with the specimen. However, in the case of HREM, both the specimen thickness and the illumination angle should be small. Therefore we may neglect the dependency of the transmission function on the incident beam direction.

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Depletion of coating color components in the blade coating process circulation

TAPPI Journal ◽

10.32964/tj10.9.17 ◽

2011 ◽

Vol 10 (9) ◽

pp. 17-23 ◽

Cited By ~ 1

Author(s):

ANNE RUTANEN ◽

MARTTI TOIVAKKA

Keyword(s):

Fine Particles ◽

Particle Density ◽

Stable Process ◽

Size Fraction ◽

Color Stability ◽

Strong Interactions ◽

Coating Process ◽

Size Segregation ◽

Coating Color ◽

Average Size

Coating color stability, as defined by changes in its solid particle fraction, is important for runnability, quality, and costs of a paper coating operation. This study sought to determine whether the size or density of particles is important in size segregation in a pigment coating process. We used a laboratory coater to study changes in coating color composition during coating operations. The results suggest that size segregation occurs for high and low density particles. Regardless of the particle density, the fine particle size fraction (<0.2 μm) was the most prone for depletion, causing an increase in the average size of the particles. Strong interactions between the fine particles and other components also were associated with a low depletion tendency of fine particles. A stable process and improved efficiency of fine particles and binders can be achieved by controlling the depletion of fine particles.

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